Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopy

Physical Review Letters

Volumn 91, Issue 19, 2003, Pages 196102/1-196102/4

  Barth, Clemens ^a   Henry, Claude R ^a  

^a CAMPUS DE LUMINY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; LATTICE CONSTANTS; MONOLAYERS; POINT DEFECTS; SINGLE CRYSTALS; SURFACE STRUCTURE; TUNGSTEN CARBIDE; ULTRAHIGH VACUUM;

ATOMIC POINT DEFECTS; ATOMIC RESOLUTION IMAGING; DYNAMIC SCANNING FORCE MICROSCOPY; ULTRAHIGH VACUUM CLEAVED MAGNESIUM OXIDE;

MAGNESIA;

EID: 0347516557     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.91.196102     Document Type: Article

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