Materials science: How to move an atom

Science

Volumn 319, Issue 5866, 2008, Pages 1051-1052

  Custance, Oscar ^a   Morita, Seizo ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FORCE; IDENTIFICATION METHOD; INSTRUMENTATION; SCANNING TUNNELLING MICROSCOPY;

ATOM; ATOMIC FORCE MICROSCOPY; FORCE; MOLECULAR PHYSICS; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; SHORT SURVEY; SURFACE PROPERTY;

EID: 39749136093     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1154853     Document Type: Short Survey

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