Probing the magnetic exchange forces of iron on the atomic scale

Nano Letters

Volumn 9, Issue 1, 2009, Pages 200-204

  Schmidt, R ^a,b,e   Lazo, C ^a,b,e   Holscher, H ^a,b,e   Pi, U H ^a,b,c,e   Caciuc, V ^a,b,d,e   Schwarz, A ^a,b,e   Wiesendanger, R ^a,b,e   Heinze, S ^a,b,e  

^a UNIVERSITY OF HAMBURG   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^d Foschungszentrum Julich ^*  (Germany)

^e FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC STRUCTURES; ATOMIC SCALE; FE MONOLAYERS; FE NANOCLUSTERS; FE-COATED; FIRST-PRINCIPLES CALCULATIONS; MAGNETIC CONFIGURATIONS; MAGNETIC EXCHANGE INTERACTIONS; MAGNETIC EXCHANGES; MAGNETIC FORCES; MAGNETIC INTERACTIONS; RELAXATION EFFECTS;

ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM;

ATOMS;

IRON; NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; GENETIC PROCEDURES; MAGNETISM; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; NANOTECHNOLOGY; ULTRASTRUCTURE;

COMPUTER SIMULATION; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IRON; MAGNETICS; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; MOLECULAR PROBE TECHNIQUES; NANOSTRUCTURES; NANOTECHNOLOGY; STRESS, MECHANICAL;

EID: 61649100571     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl802770x     Document Type: Article

References (27)

1. Prinz, G. A. Science 1998, 282, 1660.
2. Wolf, S. A.; Awschalom, D. D.; Buhrman, R. A.; Daughton, J. M.; von Molnr, S.; Roukes, M. L.; Chtchelkanova, A. Y.; Treger, D. M. Science 2001, 294, 1488.
3. Hirjibehedin, C. F.; Lutz, C. P.; Heinrich, A. J. Science 2006, 312, 1021.
4. Binnig, G.; Quate, C. F.; Gerber, C. Phys. Rev. Lett. 1986, 56, 930.
5. Wiesendanger, R.; Bürgler, D.; Tarrach, G.; Wadas, A.; Brodbeck, D.; Guntherodt, H. J.; Guntherodt, G.; Gambino, R. J.; Ruf, R. J. Vac. Sci. Technol, B 1990, 9, 519.
6. Kaiser, U.; Schwarz, A.; Wiesendanger, R. Nature 2007, 446, 522.
7. Momida, H.; Oguchi, T. Surf. Sci. 2005, 590, 42.
8. T. R., Albrecht; P., Grütter; D., Home; D., Rugar Appl. Phys. Lett. 1991, 69, 668.
9. Liebmann, M.; Schwarz, A.; Langkat, S. M.; Wiesendanger, R. Rev. Sci. Instrum. 2002, 73, 3508.
10. Kubetzka, A.; Ferriani, P.; Bode, M.; Heinze, S.; Bihlmayer, G.; von Bergmann, K.; Pietzsch, O.; Blel, S.; Wiesendanger, R. Phys. Rev. Lett. 2005, 94, 087204.
11. Bergmann, K. v.; Bode, M.; Wiesendanger, R. Phys. Rev. B 2004, 70, 174455.
12. At small tip-sample separations during atomic scale imaging, the tip of one and the same cantilever can acquire different tip configurations by spontaneous, accidental, or intended tip changes due to strong tip-sample interactions. One tip configuration might be, e.g., suitable to obtain atomic resolution and another one might be not.
13. Schwarz, A.; Wiesendanger, R. Nano Today 2008, 3, 28.
14. Kaiser, U. Schwarz, A. and Wiesendanger, R., Phys. Rev. B 2008, 78, 104418.
15. Online Supporting Information of ref 6.
16. It is common practice in scanning probe techniques like STM and NC-AFM to intentionally touch the surface with the tip collisions to obtain an atomically sharp tip apex by trial and error.
17. Perdew, J. P.; Burke, K.; Ernzerhof, M. Phys. Rev. Lett. 1996, 77, 3865.
18. Schwarz, K.; Blaha, P.; Madsen, G. K. H. Comput. Phys. Commun. 2002, 147, 71.
19. The lateral distances between adjacent multiatom tips are 9.0 A for the apex atom and 6.7 A for base atoms of the tip. Our supercell is periodic also in the z direction. Choosing a very large vacuum separation of 21 A between adjacent surfaces, however, allows the tip to approach the surface without interacting with its periodic image.
20. Giessibl, F.-J. Phys. Rev. B 1997, 56, 16010.
21. Holscher, H.; Schwarz, A.; Allers, W.; Schwarz, U. D.; Wiesendanger, R. Phys. Rev. B 2000, 61, 12678.
22. Caciuc, V.; Holscher, H.; Blel, S. Phys. Rev. B 2005, 72, 035432.
23. Dürig, U. Appl. Phys. Lett. 1999, 75, 433.
24. Sasaki, N.; Aizawa, H.; Tsukada, M. Appl. Surf. Sci. 2000, 157, 367.
25. H.
26. An experimental image of a periodic surface typically contains many unit cells, which can be used to obtain an averaged unit cell with a much better signal-to-noise ratio. The same procedure was used in ref 6 to increase the visibility of the contrast pattern.
27. Lazo, C; Caciuc, V.; Holscher, H.; Heinze, S. Phys. Rev. B 2008, 78, 214416.