Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

Review of Scientific Instruments

Volumn 79, Issue 3, 2008, Pages

  An, Toshu ^a,b   Nishio, Takahiro ^a   Eguchi, Toyoaki ^a   Ono, Masanori ^a,c   Nomura, Atsushi ^a,d   Akiyama, Kotone ^a,e   Hasegawa, Yukio ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c RIKEN   (Japan)

^d TOKYO UNIVERSITY OF SCIENCE   (Japan)

^e TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADATOMS; ATOMIC FORCE MICROSCOPY; FORCE CONTROL; IMAGING SYSTEMS; LOW TEMPERATURE EFFECTS; RESONATORS;

FORCE SENSOR; LENGTH-EXTENSION; SPATIAL RESOLUTION; VACUUM FREQUENCY-MODULATION;

FREQUENCY MODULATION;

EID: 41549114171     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2830937     Document Type: Article

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