Local force gradients on Si(111) during simultaneous scanning tunneling/atomic force microscopy

Applied Physics Letters

Volumn 90, Issue 13, 2007, Pages

  Ozgur Ozer H ^a   O'Brien, Simon J ^a   Pethica, John B ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; SCANNING TUNNELING MICROSCOPY; STIFFNESS; SURFACE PROPERTIES;

ATOMIC SITES; COVALENT FORCES; FORCE GRADIENTS;

SILICON;

EID: 34047111697     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2717115     Document Type: Article

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