Application and calibration of a quartz needle sensor for high resolution scanning force microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 17, Issue 4, 1999, Pages 1309-1312

  Clauss, W ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22644451545     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590751     Document Type: Article

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