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Volumn 16, Issue 3, 2005, Pages

Lateral manipulation of single atoms at semiconductor surfaces using atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; DATA REDUCTION; OSCILLATIONS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SURFACES; TEMPERATURE DISTRIBUTION; ULTRAHIGH VACUUM; VISUALIZATION;

EID: 15844383141     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/3/021     Document Type: Conference Paper
Times cited : (87)

References (26)
  • 17
    • 15844392631 scopus 로고    scopus 로고
    • Oyabu N, Custance O, Abe M and Morita S 2005 in preparation
    • Oyabu N, Custance O, Abe M and Morita S 2005 in preparation


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.