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Volumn 16, Issue 3, 2005, Pages
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Lateral manipulation of single atoms at semiconductor surfaces using atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CANTILEVER BEAMS;
DATA REDUCTION;
OSCILLATIONS;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTOR MATERIALS;
SURFACES;
TEMPERATURE DISTRIBUTION;
ULTRAHIGH VACUUM;
VISUALIZATION;
LATERAL MANIPULATIONS;
SEMICONDUCTOR SURFACES;
SINGLE ATOMS;
ATOMS;
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EID: 15844383141
PISSN: 09574484
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-4484/16/3/021 Document Type: Conference Paper |
Times cited : (87)
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References (26)
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