Single spin detection by magnetic resonance force microscopy

Nature

Volumn 430, Issue 6997, 2004, Pages 329-332

  Rugar, D ^a   Budakian, R ^a   Mamin, H J ^a   Chui, B W ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; SENSITIVITY ANALYSIS; SILICA; SURFACE STRUCTURE; VISUALIZATION;

ELECTRON SPINS; MAGNETIC RESONANCE FORCE MICROSCOPY (MRFM); THREE-DIMENSIONAL SPATIAL RESOLUTION;

MAGNETIC RESONANCE IMAGING;

MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; COMPUTER; ELECTRON SPIN RESONANCE; MACROMOLECULE; MEASUREMENT; MICROSCOPY; NUCLEAR MAGNETIC RESONANCE; PRIORITY JOURNAL; QUANTUM MECHANICS; THREE DIMENSIONAL IMAGING;

EID: 3142747583     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/nature02658     Document Type: Article

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