Non-contact atomic force microscopy study of atomic manipulation on an insulator surface by nanoindentation

Nanotechnology

Volumn 17, Issue 7, 2006, Pages

  Nishi, Ryuji ^a   Miyagawa, Daisuke ^a   Seino, Yoshihide ^a   Yi, Insook ^a   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INDENTATION; IONS; NANOTECHNOLOGY; SINGLE CRYSTALS;

ATOMIC MANIPULATION; IONIC CRYSTALS; NANOINDENTATION; VERTICAL MANIPULATION;

NANOSTRUCTURED MATERIALS;

EID: 33644979635     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/7/S07     Document Type: Article

References (17)

1. Morita S, Wiesendanger R and Meyer E 2002 Noncontact Atomic Force Microscopy (Berlin: Springer)
2. Oyabu N, Custance O, Yi I, Sugawara Y and Morita S 2003 Phys. Rev. Lett. 90 176102
3. Oyabu N, Sugimoto Y, Abe M, Custance O and Morita S 2005 Nanotechnology 16 S112
4. Sugimoto Y, Abe M, Hirayama S, Oyabu N, Custance O and Morita S 2005 Nat. Mater. 4 156
5. Bammerlin M, Lüthi R, Meyer E, Baratoff A, Lü J, Guggisberg M, Gerber Ch, Howald L and Güntherodt H-J 1997 Probe Microsc. 1 3
6. Bennewitz R, Schär S, Barwich V, Pfeiffer O, Meyer E, Krok F, Such B, Kolodzej J and Szymonski M 2001 Surf. Sci. Lett. 474 L197
7. Bennewitz R, Foster A S, Kantrovich L N, Bammerlin M, Loppacher Ch, Schär S, Guggisberg M, Meyer E and Shluger A L 2000 Phys. Rev. B 62 2074
8. Reichling M and Barth C 1999 Phys. Rev. Lett. 83 768
9. Gnecco E, Bennewitz R and Meyer E 2002 Phys. Rev. Lett. 88 215501
10. Socoliuc A, Gnecco E, Bennewitz R and Meyer E 2003 Phys. Rev. B 68 115416
11. Hirth S, Ostendorf F and Reichling M 2006 Nanotechnology 17 S148-54
12. Yokoyama K, Ochi T, Uchihashi T, Ashino M, Sugawara Y, Suehira N and Morita S 2000 Rev. Sci. Instrum. 71 128
13. Gotsmann B, Seidel C, Anczykowski B and Fuchs H 1999 Phys. Rev. B 60 11051
14. Bennewitz R, Pfeiffer O, Schär S, Barwich V, Meyer E and Kantorovich L N 2002 Appl. Surf. Sci. 188 232
15. Sader J E and Jarvis S P 2004 Appl. Phys. Lett. 84 1801
16. Bartels L, Meyer G and Rieder K-H 1997 Phys. Rev. Lett. 79 697
17. Pizzagalli L and Baratoff A 2003 Phys. Rev. B 68 115427