Site-specific force spectroscopy and atom interchange manipulation at room temperature

e-Journal of Surface Science and Nanotechnology

Volumn 4, Issue , 2006, Pages 376-383

  Sugimoto, Yoshiaki ^a   Custance, Óscar ^b   Abe, Masayuki ^c   Morita, Seizo ^c  

^a OSAKA UNIVERSITY   (Japan)

^b Handai Frontier Research Center   (Japan)

^c NONE

Author keywords

Atom Inlay; Atom Interchange; Atom molecule manipulation; Atomic force microscope; Site Specific Force Spectroscopy

Indexed keywords

ATOMIC BEAMS; ATOMIC FORCE MICROSCOPY; CRYSTALS; IMAGING TECHNIQUES; MOLECULES; SEMICONDUCTOR MATERIALS;

ATOM INLAY; ATOM INTERCHANGE; ATOM/MOLECULE MANIPULATION; ATOMIC FORCE MICROSCOPES; SITE-SPECIFIC FORCE SPECTROSCOPY;

ATOMIC PHYSICS;

EID: 33645785865     PISSN: 13480391     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2006.376     Document Type: Conference Paper

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