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Volumn 73, Issue 24, 2006, Pages

Manipulation of defects on oxide surfaces via barrier reduction induced by atomic force microscope tips

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33745516566     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.245435     Document Type: Article
Times cited : (27)

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