Covalent and reversible short-range electrostatic imaging in noncontact atomic force microscopy

Physical Review Letters

Volumn 91, Issue 21, 2003, Pages

  Dieška, Peter ^a   Štich, Ivan ^a   Pérez, Rubén ^b  

^a Slovak University of Technology (FEI STU)   (Slovakia)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CHARGE TRANSFER; CHEMICAL BONDS; COMPUTER SIMULATION; COPPER; ELECTROSTATICS; IMPURITIES; MATHEMATICAL MODELS; SEMICONDUCTING SILICON; SURFACES;

ATOMIC RESOLUTION; COVALENT BOND IMAGING; ELECTROSTATIC IMAGING;

ATOMIC FORCE MICROSCOPY;

EID: 0345790146     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.91.216401     Document Type: Article

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