Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy

Physical Review Letters

Volumn 90, Issue 17, 2003, Pages

  Oyabu, Noriaki ^a   Custance, Óscar ^b   Yi, Insook ^b   Sugawara, Yasuhiro ^a,b   Morita, Seizo ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b Handai Frontier Research Center   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; LOW TEMPERATURE EFFECTS; PERTURBATION TECHNIQUES; SEMICONDUCTING SILICON; SURFACES;

NEAR CONTACT ATOMIC FORCE MICROSCOPY; SINGLE ATOMS; SOFT NANOINDENTATION;

ATOMS;

EID: 1442295401     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (33)

1. S. Morita, R. Wiesendanger, and E. Meyer, Noncontact Atomic Force Microscopy (Springer-Verlag, Berlin, 2002).
2. S. Orisaka, T. Minobe, T. Uchihashi, Y. Sugawara, and S. Morita, Appl. Surf. Sci. 140, 243 (1999).
3. Ch. Loppacher et al., Phys. Rev. B 62, 16 944 (2000).
4. F. J. Giessibl, Science 267, 68 (1995).
5. Y. Sugawara, M. Ohta, H. Ueyama, and S. Morita, Science 270, 1646 (1995).
6. M. Reichling and C. Barth, Phys. Rev. Lett. 83, 768 (1999).
7. C. Barth and M. Reichling, Nature (London) 414, 54 (2001).
8. M. A. Lantz et al., Science 291, 2580 (2001).
9. D. M. Eigler, and E. K. Schweizer, Nature (London) 344, 524 (1990).
10. D. M. Eigler, C. P. Lutz, and W. E. Rudge, Nature (London) 352, 600 (1991).
11. L. Bartels, G. Meyer, and K. -H. Rieder, Phys. Rev. Lett. 79, 697 (1997).
12. G. Dujardin et al., Phys. Rev. Lett. 80, 3085 (1998).
13. G. Meyer, B. Neu, and K. -H. Rieder, Appl. Phys. A 60, 343 (1995).
14. T. A. Jung, R. R. Schlittler, J. K. Gimzewski, H. Tang, and C. Joachim, Science 271, 181 (1996).
15. B. C. Stipe, M. A. Rezaei, and W. Ho, Science 279, 1907 (1998).
16. B. C. Stipe, M. A. Rezaei, and W. Ho, Phys. Rev. Lett. 79, 4397 (1997).
17. H. J. Lee and W. Ho, Science 286, 1719 (1999).
18. J. R. Hahn and W. Ho, Phys. Rev. Lett. 87, 166102 (2001).
19. A. J. Heinrich, C. P. Lutz, J. A. Gupta, and D. M. Eigler, Science 298, 1381 (2002).
20. N. Suehira, Y. Tomiyoshi, Y. Sugawara, and S. Morita, Rev. Sci. Instrum. 72, 2971 (2001).
21. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991).
22. H. Ueyama, Y. Sugawara, and S. Morita, Appl. Phys. A 66, S295 (1998).
23. As a result of a soft nanoindentation performed by using NC-AFM, the removal or deposition of single atoms was normally achieved. Nevertheless, in some cases, two additional events could be observed after a soft nanoindentation. One was the deposition of material at the selected position in atom cluster form, presumably coming from the tip. The other was no detectable change observed in the surface even though a jump in the frequency shift was obtained.
24. I. -W. Lyo and P. Avouris, Science 253, 173 (1991).
25. A. Kobayashi, F. Grey, R. S. Williams, and M. Aono, Science 259, 1724 (1993).
26. H. Uchida, D. Huang, F. Grey, and M. Aono, Phys. Rev. Lett. 70, 2040 (1993).
27. Y. Sugawara, Y. Sano, N. Suehira, and S. Morita, Appl. Surf. Sci. 188, 285 (2002).
28. F. J. Giessibl, Phys. Rev. B 56, 16010 (1997).
29. R. Pérez, M. C. Payne, I. Štich, and K. Terakura, Phys. Rev. Lett. 78, 678 (1997).
30. R. Pérez, M. C. Payne, and A. D. Simpson, Phys. Rev. Lett. 75, 4748 (1995).
31. R. Pérez, I. Štich, M. C. Payne, and K. Terakura, Phys. Rev. B 58, 10 835 (1998).
32. S. H. Ke, T. Uda, R. Pérez, I. Štich, and K. Terakura, Phys. Rev. B 60, 11631 (1999).
33. N. Oyabu et al. (to be published).