Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching: Application to rough and natural surfaces

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces

Volumn , Issue , 2006, Pages 1-292

  Kaupp, Gerd ^a   Avouris, Phaedon ^b   Bhushan, Bharat ^c   Von Klitzing, Klaus ^d   Sakaki, Hiroyuki ^e   Wiesendanger, Roland ^f  

^a UNIVERSITY OF OLDENBURG   (Germany)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c OHIO STATE UNIVERSITY   (United States)

^d MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^e INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^f UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84891968523     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-3-540-28472-7     Document Type: Book

References (460)

1. G. Kaupp: Photochemie auf neuen Wegen: AFM bei Festkörperphotolysen. Lecture at Arbeitstagung Photochemie, Waldbärenburg (close to Dresden, Germany), March 20-22 (1991)
2. G. Kaupp: Atomic force microscopy in organic gas/solid reactions: How do the new phases build up? Lecture at ICCOSS X, 10th International Conference on the Chemistry of the Organic Solid State, OC 8, Vancouver, July 9-12 (1991)
3. G. Kaupp: New advent in photochemistry: Atomic force microscopy. Lecture at XVth International Conference on Photochemistry, VI-2, Paris, 28.7.-2.8. (1991)
4. G. Kaupp: AFM with nonconducting organic crystals. Lecture at STM'91, International Conference on Scanning Tunneling Microscopy, Interlaken, PC/5, 12.8.-16.8. (1991)
5. G. Kaupp: Photodimerization of cinnamic acid in the solid state: New insights on application of atomic force microscopy. Angew. Chem. Int. Ed. Engl. 31, 592-594 (1992)
6. G. Kaupp: Photodimerization of Anthracenes in the Solid State: New Results from Atomic Force Microscopy. Angew. Chem. Int. Ed. Engl. 31, 594-597 (1992)
7. G. Kaupp: Atomic force microscopy in organic gas/solid reactions: How do the new phases build up? Mol. Cryst. Liq. Cryst. 211, 1-15 (1992)
8. S.A.C. Gould, B. Drake, C.B. Prater, A.L.Weisenhorn, S. Manne, H.G. Hansma, P.K. Hansma, J. Massie, M. Longmire, V. Elings, B. Dixon Northern, B. Mukergee, C.M. Peterson, W. Stoeckenius, T.R.Albrecht, C.F. Quate: From atoms to integrated circuit chips, blood cells, and bacteria with the atomic force microscope. J. Vac. Sci. Technol. A 8, 369-373 (1990)
9. J.H. Hoh, P.K. Hansma: Atomic force microscopy for high-resolution imaging in cell biology. Trends Cell Biol. 2, 208-213 (1992)
10. M.C. Goh, P. Markiewicz: The Atomic Force Microscope. Chem. Ind. 1992, 687-691.
11. +-implanted silicon investigated by scanning probe microscopy. Wear 162-164, 733-738 (1993)
12. U.D. Schwarz, H. Haefke, P. Reimann, H. J. Güntherodt: Tip artefacts in scanning force microscopy. J. Microsc. 173, 183-197 (1994)
13. G. Binnig, C.F. Quate, C.H. Gerber: Atomic force microscope. Phys. Rev. Lett. 56, 930-933 (1986)
14. E. Betzig, P. L. Finn, J. S. Weiner: Combined shear force and near-field scanning optical microscopy. Appl. Phys. Lett. 60, 2484-2486 (1992)
15. P.C. Yang, Y. Chen, M. Vaez-Iravani: Attractive mode atomic force microscopy with optical detection in an orthogonal cantilever/sample configuration. J. Appl. Phys. 71, 2499-2502 (1992)
16. Q. Zhong, D. Innis, K. Kjoller, V. B. Elings: Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy. Surf. Sci. Lett. 290, L688-L692 (1993)
17. M. Dreier, D. Anselmetti, H. J. Güntherodt: Dynamic force microscopy in liquids. J. Appl. Phys. 76, 5095-5098 (1994)
18. A. Schirmeisen, B. Anczykowski, H. Fuchs: in Applied Scanning Probe Methods, (eds. B. Bushan, H. Fuchs, S. Hosaka), 3-39, Springer, Berlin (2004)
19. Noncontact Atomic Force Microscopy, S. Morita, R. Wiesendanger, E. Meyer (eds.), Springer, Berlin (2002)
20. Applied Scanning Probe Methods, B. Bushan, H. Fuchs, S. Hosaka (eds.), Springer, Berlin (2004)
21. Scanning Probe Microscopy Analytical Methods, R. Wiesendanger (ed.), Springer, Berlin (1998)
22. S.N. Magonov, M.H. Whangbo: Surface Analysis with STM and AFM, VCH, Weinheim, 1996
23. S. Magonov: Visualization of polymer structures with atomic force microscopy. pp. 207-251 in [20]
24. G. Kaupp, J. Schmeyers, M. Haak, T. Marquardt, M. Plagman, M. Juniel-Kramer: Erforschung von Systemlösungen für transparente Verschleißschut-zschichten auf Kunststoffen für die Optik: Organische Schichten und organische Haftvermittlungsschichten mit kovalenter Anbindung. BMBF Forschungs-bericht 13N6250, 1997, 1-63; Available at docdel@tib.uni- hannover.de
25. G. Binnig, D.P.E. Smith: Single-tube three-dimensional scanner for scanning tunneling microscopy. Rev. Sci. Instrum. 57, 1688-1689 (1986)
26. C.J. Chen: Electromechanical deflections of piezoelectric tubes with quartered electrodes. Appl. Phys. Lett. 60, 132-134 (1992)
27. 3 piezoscanner for probe microscopes with atomic resolution. Rev. Sci. Instrum. 64, 3534-3537 (1993)
28. T. Akiyama, U. Staufer, N.F. Rooij, D. Lange, C. Hagleitner, O. Brand, H. Baltes, A. Tonin, H.R. Hidber: Integrated atomic force microscopy array probe with metal-oxide-semiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metal-oxide-semiconductor electronics. J. Vac. Sci. Technol. B 18, 2669-2675 (2000)
29. T.R. Albrecht, S. Akamine, T.E. Carver, C.F. Quate: Microfabrication of cantilever styli for the atomic force microscope. J. Vac. Sci. Technol. A 8, 3386-3396 (1990)
30. O. Wolter, T. Bayer, J. Greschner: Micromachined silicon sensors for scanning force microscopy. J. Vac. Sci. Technol. B 9, 1353-1357 (1991)
31. M. Yamaki, T. Miwa, H. Yoshimura, K. Nagayama: Efficient microtip fabrication with carbon coating and electron beam deposition for atomic force microscopy. J. Vac. Sci. Technol. B 10, 2447-2450 (1992)
32. H. Ximen, P.E. Russell: Microfabrication of AFM tips using focused ion and electron beam techniques. Ultramicroscopy, 42-44, 1526-1532 (1992)
33. C.V. Nguyen, K.J. Chao, R.M.D. Stevens, L. Delzeit, A. Cassell, J. Han, M. Meyyappan: Carbon nanotube tip probes: Stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors. Nanotechnology 12, 363-367 (2001)
34. A. Marquez-Lucero, J.A. Gomez, R. Caudillo, M. Miki-Yoshida, M. Jose-Yacaman: A method to evaluate the tensile strength and stress-strain relationship of carbon nanofibers, carbon nanotubes, and C-Chains. Small 1, 640-644 (2005)
35. H. Kado, K. Yokoyama, T. Tohda: Atomic force microscopy using ZnO whisker tip. Rev. Sci. Instrum. 63, 3330-3332 (1992)
36. W. Lee, H.G. Sohn, J.M. Myoung: Prediction of the structural performance of ZnO nanowires grown on GaAs (001) substrates by metalorganic chemical vapor deposition (MOCVD). Mater. Sci. Forum 449-452, 1245-1248 (2004)
37. S. Akamine, R.C. Barrett, C.F. Quate: Improved atomic force microscope images using microcantilevers with sharp tips. Appl. Phys. Lett. 57, 316-318 (1990)
38. T. Hantschel, E.M. Chow, D. Rudolph, D. Fork: Stressed metal probes for atomic force microscopy. Appl. Phys. Lett. 81, 3070-3072 (2002)
39. T. Hantschel, E.M. Chow, D.K. Fork: Scanning probe system with spring probe. US Pat. Appl. Publ. US 20030182993 (2003)
40. T. Hantschel, E.M. Chow, D.K. Fork, M.A. Rosa, D. De Bruyker: Scanning probe system with spring probe and actuation/sensing structure. US Pat. Appl. Publ. US 20030183761 (2003)
41. T. Hantschel, E.M. Chow, D. Rudolph, C. Shih, L. Wong, D.K. Fork: Stressed-metal NiZr probes for atomic force microscopy. Microelectron. Eng. 67-68, 803-809 (2003)
42. T. Mariani, C. Frediani, C. Ascoli: A three-dimensional scanner for probe microscopy on the millimetre scale. Appl. Phys. A 66, S861-S866 (1998)
43. T. Mariani, C. Ascoli, P. Baschieri, C. Frediani, A. Musio: Scanning force images through the 'Milliscope'-a probe microscope with very wide scan range. J. Microsc. 204, 53-60 (2001)
44. G. Kaupp, J. Schmeyers, U. Pogodda, M. Haak, T. Marquardt, M. Plagmann: AFM for the imaging of large and steep submicroscopic features, artifacts and scraping with asymmetric cantilever tips. Thin Solid Films 264, 205-211 (1995)
45. D. Keller: Reconstruction of STM and AFM images distorted by finite-size tips. Surf. Sci. 253, 353-364 (1991)
46. D. Keller, F. S. Franke: Envelope reconstruction of probe microscope images. Surface Science 294, 409-419 (1993)
47. L. Montelius, J. O. Tegenfeldt: Direct observation of the tip shape in scanning probe microscopy. Appl. Phys. Lett. 62, 2628-2630 (1993)
48. G. Kaupp: Atomic force microscopy in the photochemistry of chalcones. J. Microsc. 174, 15-22 (1994)
49. P. Dietz, K.H. Herrmann, O. Inacker, H.D. Lehmann, P.K. Hansma: Scanning force microscopy of synthetic membranes in air and under water: surfaces, cross-sections and fouling. Proc. SPIE 1639, 186-197 (1992)
50. A.K. Fritzsche, A.R. Arevalo, A.F. Connolly, M.D. Moore, V. Elings, C.M. Wu: The structure and morphology of the skin of polyethersulfone ultrafiltra-tion membranes: A comparative atomic force microscope and scanning electron microscope study. J. Appl. Polymer Sci. 45, 1945-1956 (1992)
51. H. Kamusewitz, M. Keller, D. Paul: Membrane characterization by means of pneumatic scanning force microscopy. Thin Solid Films 264, 184-193 (1995)
52. D.J. Shuman: Scanning tip orientation adjustment method for atomic force microscopy. US Pat. Appl. Publ. US 2004200261 (2004)
53. G.C. Gazzadi, P. Luches, S. F. Contri, A. di Bona, S. Valeri: Submicron-scale patterns on ferromagnetic-antiferromagnetic Fe/NiO layers by focused ion beam (FIB) milling. Nucl. Instrum. Methods Phys. Res., B 230, 512-517 (2005)
54. G. Kaupp, A. Herrmann, M. Haak: Review Commentary-Artifacts in scanning near-field optical microscopy (SNOM) due to deficient tips. J. Phys. Org. Chem. 12, 797-807 (1999)
55. P. Maivald, H.J. Butt, S.A.C. Gould, C.B. Prater, B. Drake, J.A. Gurley, V.B. Elings, P.K. Hansma: Using force modulation to image surface elasticities with the atomic force microscope. Nanotechnology 2, 103-106 (1991)
56. J.E. Houston: Interfacial force microscopy; Selected applications, pp. 41-73 in [20]
57. V. Scherer, M. Reinstädtler, W. Arnold: Atomic force microscopy with lateral modulation, pp. 75-115 in [20]
58. B. Bhushan: Micro/nanotribology studies using scanning probe microscopy, pp. 171-205 in [20]
59. G. Kaupp: Solid-state molecular syntheses: complete reactions without auxiliaries based on the new solid-state mechanism Cryst. Eng. Commun. 5, 117-133 (2003)
60. G. Kaupp: Nanostructures or submicrostructures from gas/solid reactions as probed by atomic force microscopy. J. Vac. Sci. Technol. B 12, 1952-1956 (1994)
61. G. Kaupp, M. Plagmann: Atomic force microscopy and solid state photolyses: Phase rebuilding. J. Photochem. Photobiol. A 80, 399-407 (1994)
62. B. Bushan: Nanotribologic scratching wear, local deformation, pp. 147-168 in [20]
63. J. M. Helt, J. D. Battaes: Wear of Mica under Aqueous Environments: Direct Observation of Defect Nucleation by AFM. Langmuir 21, 633-639 (2005)
64. R. Kaneko, E. Hamada: Microwear processes of polymer surfaces Wear 162-164, 370-377 (1993)
65. G. Kaupp: AFM and STM in photochemistry including photon tunneling. Adv. Photochem. 19, 119-177 (1995)
66. G. Kaupp: AFM on chemically reacting crystals. Mol. Cryst. Liq. Cryst. 242, 153-169 (1994)
67. G. Kaupp: Unpublished results
68. G. Kaupp, A. Herrmann: Unpublished results
69. G. Kaupp: Supermikroskopie bei organischen Kristallreaktionen. Chem unserer Zeit, 31, 129-139 (1997)
70. P. E. Hillner, A.J. Gratz, S. Manne, P.K. Hansma: Atomic-scale imaging of calcite growth and dissolution in real time. Geology 20, 359-362 (1992)
71. T. Maeda, G.H. Lee, T. Ohnishi, M. Kawasaki, M. Yoshimoto, H. Koinuma: Molecular layer-by-layer growth of SrTiO3 and BaTiO3 films by laser molecular beam epitaxy. Materials Science & Engineering B 41, 134-137 (1996)
72. M. Yoshimoto, T. Ohnishi, G.H. Lee, K. Sasaki, H. Maruta, H. Koinuma: Atomic-scale analysis of laser MBE growth of oxide thin films by in situ RHEED and CAICISS. Mater. Res. Soc. Symp. Proc. 502, 227-236 (1998)
73. A. Brazdeikis, A.S. Flodstroem: Surface morphology and nucleation of infinite-layer (Sr, Ca)CuO2 films on atomically flat SrTiO3 (100) substrates studied by atomic force microscopy. Appl. Surf. Sci. 107, 95-101 (1996)
74. G. Kaupp, U. Pogodda, J. Schmeyers: Gas/Solid Reactions with Acetone. Chem. Ber. 127, 2249-2261 (1994)
75. J. Uilk, S. Bullock, E. Johnston, S.A. Myers, L. Merwin, K.J. Wynne: Surface science of elastomeric coatings prepared from a, ω-dihydroxypoly (dimethylsiloxane) and the ethoxysiloxane mixture "ES40". Macromolecules 33, 8791-8801 (2000)
76. G. Kaupp, M. Haak: Phase rebuilding of a-cinnamic acid in tail irradiations. Mol. Cryst. Liq. Cryst. 313, 193-198 (1998)
77. G. Kaupp, J. Schmeyers, J. Boy: Quantitative gas-solid reactions with ClCN and BrCN: Synthesis of cyanamides, cyanates, thiocyanates, and their derivatives. Chem. Eur. J. 4, 2467-2474 (1998)
78. G. Kaupp, J. Schmeyers: gas-solid reactions of aliphatic amines with thiohy-dantoins: Atomic force microscopy and new mechanisms. Angew. Chem. Int. Ed. Engl. 32, 1587-1589 (1993).
79. G. Kaupp, J. Schmeyers: Unpublished results
80. A. Herrmann, G. Kaupp, T. Geue, U. Pietsch: Atomic force microscopy and grazing incidence diffraction investigation of the gas-solid diazotization of sul-fanilic acid. Mol. Cryst. Liq. Cryst. 293, 261-275 (1997)
81. G. Kaupp, J. Boy: Unpublished results
82. S. Nakatsuji, A. Takai, M. Mizumoto, H. Anzai, K. Nishikawa, Y. Morimoto, N. Yasuoka, J. Boy, G. Kaupp: Preparation and magnetic properties of novel CT complexes derived from organic stable radicals. Mol. Cryst. Liq. Cryst. 334, 177-184 (1999)
83. G. Kaupp, A. Herrmann, J. Schmeyers: Waste-free chemistry of diazonium salts and benign separation of coupling products in solid salt reactions. Chem. Eur. J. 8, 1395-1406 (2002)
84. G. Kaupp, J. Schmeyers, F. Toda, H. Takumi, H. Koshima: Mechanism of solid-solid resolution of pantolactone. J. Phys. Org. Chem. 9, 795-800 (1996)
85. G. Kaupp, A. Kuse: 100% yield in 300 gas-solid reactions covering 22 reaction types: A benign option for industrial solid-state production. Mol. Cryst. Liq. Cryst. 313, 361-366 (1998)
86. G. Kaupp, M. Haak: E/Z isomerization in crystals-phase rebuilding on photolysis with long-wavelength radiation. Angew. Chem. Int. Ed. Engl. 35, 2774-2777 (1996)
87. G. Kaupp, J. Schmeyers: Gas/solid reactions with nitrogen dioxide. J. Org. Chem. 60, 5494-5503 (1995)
88. M.A. Rodriguez, S.D. Bunge: Diphenylamine. Acta Crystallogr. E 59, o1123-o1125 (2003)
89. Y.Y. Wei, B. Tinant, J.P. Declercq, M.V. Meerssche: Structures of Four para-substituted 1, 1-diphenylethylene derivatives: 4, 4'-ethylenedibenzonitrile (I); 4, 4'-ethylenedianisole (II); p-(1-phenylethylene)anisole (III) and N, N-Dimethyl-4-(1-p-Nitrophenylethylene)aniline (IV). Acta. Crystallogr. C 43, 86-89 (1987)
90. G. Kaupp: Supermicroscopy in Supramolecular Chemistry: AFM, SNOM, and SXM, in Comprehensive Supramolecular Chemistry, Vo l. 8, 381-423 + 21 color plates (ed. J.E.D. Davies), Elsevier, Oxford (1996)
91. G. Kaupp: Solid-state reactivity/gas-solid and solid-solid reactions in Encyclopedia of Supermolecular Chemistry, Taylor & Francis, E-ESMC-120024356 (2005)
92. G.M.J. Schmidt: Photodimerization in the solid state. Pure. Appl. Chem. 27, 647-678 (1971)
93. E. Heller, G.M.J. Schmidt: Topochemistry XXXIII. Solid-state photochemistry of some anthracene derivatives. Israel J. Chem. 9, 449-462 (1971)
94. J.R. Green, D.R. Wheeler: X-ray investigation of some plastic crystals. II. Density of vacancies in cyclohexane, cyclohexanol, and dl-camphene. Mol. Cryst. Liq. Cryst. 6, 13-21 (1969)
95. G. Kaupp, J. Schmeyers, J. Boy: Waste-free solid-state syntheses with quantitative yield. Chemosphere 43, 55-61 (2001)
96. J. Schmeyers, F. Toda, J. Boy, G. Kaupp: Quantitative solid-solid synthesis of azomethines. J C.S. Perkin 2 1998, 989-993; addendum 2001, 132
97. G. Kaupp, J. Schmeyers, M. Haak, T. Marquardt, A. Herrmann: AFM in organic solid state reactions. Mol. Cryst. Liq. Cryst. 276, 315-337 (1996)
98. Y. Yoshida, B. Van Meerbeek, J. Snauwaert, L. Hellemans, P. Lambrechts, G. Vanherle, K. Wakasa, D.H. Pashley: A novel approach to AFM characterization of adhesive tooth-biomaterial interfaces. J. Biomed. Mater. Res. A 47, 85-90 (1999)
99. G. Kaupp: Atomic force microscopy on photoreactive organic solids: Nano-structures. Mol. Cryst. Liq. Cryst. 252, 259-268 (1994)
100. B. Marciniak, E. Rozycka-Sokolowska, V. Pavlyuk: 2-Naphthalenol. Acta Crys-tallogr. E 59, o52-o53 (2003)
101. S. Ebbinghaus, D. Abeln, M. Epple: Diphenylmethanol, CCDC, deposit no. 108059
102. R. Toledo-Crow, P.C. Yang, Y. Chen, M. Vaez-Iravani: Near-field differential scanning optical microscope with atomic force regulation. Appl. Phys. Lett. 60, 2957-2959 (1992)
103. R.D. Grober, T.D. Harris, J.K. Trautman, E. Betzig: Design and implementation of a low temperature near-field scanning optical microscope. Rev. Sci. Instrum. 65, 626-631 (1994)
104. K. Karrai, R.D. Grober: Piezoelectric tip-sample distance control for near-field optical microscopes. Appl. Phys. Lett. 66, 1842-1844 (1995)
105. R. Brunner, A. Bietsch, O. Hollricher, O. Marti: Distance control in near-field optical microscopy with piezoelectric shear-force detection suitable for imaging in liquids. Rev. Sci. Instrum. 68, 1769-1772 (1997)
106. Y. Isono, T. Namazu, T. Tanaka: AFM bending testing of nanometric single crystal silicon wire at intermediate temperatures for MEMS. IEEE International Conference. On Micro-Electro-Mechanical Systems, Technical Digest, 14th, Interlaken, Switzerland, pp. 135-138; published by Institute of
107. Electrical and Electronics Engineers, New York, NY (2001)
108. Chem Abstr. 135: 100824 (2001)
109. M.A.D. Roby, G.C. Wetsel, C.Y. Wang: Scanned probe lateral-force determination of fluid-dynamic effects near a solid surface in air. Appl. Phys. Lett. 69, 130-132 (1996)
110. M.J. Gregor, P.G. Blome, J. Schöfer, R.G. Ulbrich: Probe-surface interaction in near-field optical microscopy: The nonlinear bending force mechanism. Appl. Phys. Lett. 68, 307-309 (1996)
111. E. Teixeira-Neto, G. Kaupp, F. Galembeck: Latex particle heterogeneity and clustering films. J. Phys. Chem. 107, 14255-14260 (2003)
112. E. Teixeira-Neto, G. Kaupp, F. Galembeck: Spatial distribution of serum solutes on dry latex sub-monolayers determined by SEPM, SNOM, SC microscopy. Coll. Surf., A 243, 79-87 (2004)
113. M. Sassaki, R.A. Douglas, M.U. Kleinke, O. Teschke: Structure imaging by atomic force microscopy and transmission electron microscopy of different light emitting species of porous silicon. J. Vac. Sci. Technol. B 14, 2432-2437 (1996)
114. K. Sinniah, J. Paauw, J. Ubels: Investigating live and fixed epithelial and fibroplast cells by atomic force microscopy. Cur. Eye Res. 25, 61-68 (2002)
115. M. Targosz, P. Czuba, M. Szymonski: Erythrocyte surface modification due to the pharmacological treatment studied with atomic force microscopy. Opt. Appl. 32, 275-281 (2002)
116. M. Girasole, A. Cricenti, R. Generosi, A. Congiu-Castellano, G. Boumis, G. Amiconi: Artificially induced unusual shape of erythrocytes: An atomic force microscopy study. J. Microsc. 204, 46-52 (2001)
117. A. Mai, W. Weerachatyanukul, M. Tomietto, D.D.M. Wayner, G. Wells, R. Balhorn, A. Leader, J.L. Cyr, N. Tanphaichitr: Use of atomic force microscopy for morphological analyses of acrosome intact and acrosome-reacted human sperm. Mol. Reproduct. Dev. 63, 471-479 (2002)
118. C. Rotsch, K. Jacobson, J. Condeelis, M. Radmacher: EGF-stimulated lamel-lipod extension in adenocarcinoma cells. Ultramicroscopy 86, 97-106 (2001)
119. S.W. Schneider, P. Pagel, C. Rotsch, T. Danker, H. Oberleithner, M. Rad-macher, A. Schwab: Volume dynamics in migrating epithelial cells measured with atomic force microscopy. Pflug. Archiv: Eur. J. Physiol. 439, 297-303 (2000)
120. S.W. Schneider, Y. Yano, B.E. Sumpio, B.P. Jena, J.P. Geibel, M. Gekle, H. Oberleithner: Rapid aldosterone-induced cell volume increase of endothelial cells measured by the atomic force microscope. Cell Biol. Int. 21, 759-768 (1997)
121. R.C. Anderson, R.G. Haverkamp, P.L. Yu: Investigation of morphological changes to Staphylococcus aureus induced by ovine-derived antimicrobial peptides using TEM and AFM. FEMS Microbiol. Let. 240, 105-110 (2004)
122. A. da Silva, O. Teschke: Effects of the antimicrobial peptide PGLa on live Escherichia coli. Biochimica et biophysica acta 1643, 95-103 (2003)
123. P.C. Braga, D. Ricci, M. Dal Sasso: Daptomycin morphostructural damage in Bacillus cereus visualized by atomic force microscopy. J. Chemotherapy 14, 336-341 (2002)
124. M. Stolz, D. Stoffler, U. Aebi, C. Goldsbury: Monitoring biomolecular interactions by time-lapse atomic force microscopy. J. Struct. Biol. 131, 171-180 (2000)
125. N.M. Kad, N.H. Thomson, D.P. Smith, D.A. Smith, S.E. Radford: Beta(2)-microglobulin and its deamidated variant, N17D from amyloid fibrils with a range of morphologies in vitro. J. Mol. Biol. 313, 559-571 (2001)
126. H. Lin, R. Bhatia, R. Lal: Amyloid beta protein forms ion channels: implications for Alzheimer's disease pathophysiology. FASEB J: Off. Publ. Federat. Am. Soc. Exper. Biol. 15, 2433-2544 (2001)
127. Erratum in FASEB J. 16, 759 (2002)
128. R. Liu, C. McAllister, Y. Lyubchenko, M.R. Sierks: Residues 17-20 and 30-35 of beta-amyloid play critical roles in aggregation. J. Neurosci. Res. 75, 162-171 (2004)
129. V. Baranauskas, I. Garavello-Freitas, Z. Jingguo: Observation of the bone matrix structure of intact and regenerative zones of tibias by atomic force microscopy. J. Vac. Sci. Technol. A 19, 1042-1045 (2001)
130. H.F. Knapp, G. C. Reilly, A. Stemmer, P. Niederer, M.L. Knothe Tate: Development of preparation methods for and insights obtained from atomic force microscopy of fluid spaces in cortical bone. Scanning 24, 25-33 (2002)
131. N. Nakabayashi, A. Watanabe, K. Igarashi: AFM observation of collapse and expansion of phosphoric acid-demineralized dentin. J. Biomed. Mater. Res. A 68, 558-565 (2004)
132. E. Yonemochi: Assessment of drug characteristics by atomic force microscopy (AFM). Yakuzaigaku 63, 129-132 (2003)
133. P.G. Royall, D.Q.M. Craig, D.M. Price, M. Reading, T.J. Lever: An investigation into the use of microthermal analysis for the solid state characterization of an HPMC tablet formulation. Int. J. Pharm. 192, 97-103 (1999)
134. A. zur Muehlen, E. zur Muehlen, H. Niehus, W. Mehnert: Atomic force microscopy studies of solid lipid nanoparticles. Pharm. Res. 13, 1411-1416 (1996)
135. A. Ringqvist, L.S. Taylor, K. Ekelund, G. Ragnarsson, S. Engstrom, A. Axelsson: Atomic force microscopy analysis and confocal Raman microimag-ing of coated pellets. Int. J. Pharmaceutics 267, 35-47 (2003)
136. L. Mu, M.M. Teo, H.Z. Ning, C.S. Tan, S.S. Feng: Novel powder formulations for controlled delivery of poorly soluble anticancer drug: Application and investigation of TPGS and PEG in spray-dried particulate systems. J. Controlled Release 103, 565-575 (2005)
137. T. Li, K. Park: Fractal analysis of pharmaceutical particles by atomic force microscopy. Pharm. Res. 15, 1222-1232 (1998)
138. M.S. Schwarzenbach, P. Reimann, V. Thommen, M. Hegner, M. Mumenthaler, J. Schwob, H.J. Guentherodt: Topological structure and chemical composition of inner surfaces of borosilicate vials. J. Pharmac. Sci. Technol. 58, 169-175 (2004)
139. A. Karbach, D. Drechsler: Atomic force microscopy-a powerful tool for industrial applications. Surface and Interface Analysis 27, 401-409 (1999)
140. G.K. Bar, G.F. Meyers: The application of atomic force microscopy to the characterization of industrial polymer materials. MRS Bull. 29, 464-470 (2004)
141. G.S. Blackman, L. Lin, R.R. Matheson: Micro-and Nano-Wear of Polymeric Materials. ACS Symp. Ser. 741, 258-269 (2000)
142. M.C. Porte-Durrieu, C. Aymes-Chodur, N. Betz, C. Baquey: Development of heparin-like polymers using swift heavy ion and gamma radiation. I. Preparation and characterization of the materials. J. Biomed. Mater. Res. 52, 119-127 (2000)
143. B.A. Konduk, A.H. Ucisik: A study on the characterization and biostability of used and virgin dialysis membranes and biocompatibility of the composite biomaterials. J. Aust. Ceram. Soc. 37, 63-81 (2001)
144. P. Lemoine, J.M. Mc Laughlin: Continuity and topography of ultrathin diamond-like carbon films characterized by scanning electron microscopy/energy dispersive X-ray analysis and atomic force microscopy. J. Vac. Sci. Technol. A 17, 176-182 (1999)
145. 3. Surf. Coat. Technol. 188-189, 107-115 (2004)
146. A. Portinha, V. Teixeira, A. Monteiro, M.F. Costa, N. Lima, J. Martins, D. Martinez: Surface analysis of nanocomposite ceramic coatings. Surf. Interf. Anal. 35, 723-728 (2003)
147. K. Yamana, M. Miyamoto, S. Nakamura, K. Kihara: AFM observations of ceramic surfaces. Key Eng. Mater. 111-112, 57-70 (1995)
148. B. Baretzky, B. Reinsch, U. Taeffner, G. Schneider, M. Ruehle: Continuous microscopy of ceramic materials with atomic force microscopy. Z. Metallkd. 87, 332-340 (1996)
149. M.G. Gee, N.J. McCormick: 3D topography measurements of ceramics. Nat. Phys. Laboratory (United Kingdom) Report CMMT(A) 35, 1-13 (1996)
150. J. Burger, G. Dietler, M. Binggeli, R. Christoph, O. Marti: Aspects of the surface roughness of ceramic bonding tools on a nanometer scale investigated with atomic force microscopy. Thin Solid Films 253, 308-310 (1994)
151. C.E. Rabke: Precision failure analysis and QC inspection. Adv. Mater. Processes 156, 32-34 (1999)
152. S. Palomares-Sanchez, S. Ponce-Castaneda, F. Ruiz, M. Mirabal-Garcia, J.R. Martinez: Topographic characterization of barium hexaferrite powders using AFM. Scr. Mater. 34, 1195-1200 (1996)
153. 2 films prepared via sol-gel technique. J. Mater. Sci. 37, 3855-3860 (2002)
154. A.E. Rokhvarger, L.A. Chigrinsky: Unconventional nanoparticle technology of superconductor ceramic articles. Mater. Res. Soc. Symp. Proc. 776, 49-54 (2003)
155. S. Salgado, C. Perez, C. Diaz, J.G. Banuelos, J.M. Saniger: Residues as alternative raw materials in glass ceramic, Environment Conscious Materials: Ecomaterials. Proceedings International Symposium Ottawa, Aug. 20-23, 2000, 309-314, Publisher: Canad. Institute of Mining, Metallurgy and Petroleum, Montreal (2000)
156. B. Karmakar, G. Heide, G.H. Frischat: Comparative atomic force and scanning electron microscopic studies disclosing nanocrystallinity in cordierite glass-ceramics: Examples of surface modification. Indian J. Phys. A 78, 47-51 (2004)
157. A. Bottino, G. Capannelli, A. Grosso, O. Monticelli, O. Cavalleri, R. Rolandi, R. Soria: Surface characterization of ceramic membranes by atomic force microscopy. J. Membrane Sci. 95, 289-296 (1994)
158. M.M. Cortalezzi, J. Rose, G.F. Wells, J.Y. Bottero, A.R. Barron, M.R. Wiesner: Ceramic membranes derived from ferroxane nanoparticles: A new route for the fabrication of iron oxide ultrafiltration membranes. J. Membrane Sci. 227, 207-217 (2003)
159. I.B. Leonor, A. Ito, K. Onuma, N. Kanzaki, R.L. Reis: In vitro bioactivity of starch thermoplastic/hydroxyapatite composite biomaterials: An in situ study using atomic force microscopy. Biomaterials 24, 579-585 (2002)
160. L. Blunt, X.Q. Jiang: Three dimensional measurement of the surface topography of ceramic and metallic orthopaedic joint prostheses. J. Mater. Sci. Mater. Med. 11, 235-246 (2000)
161. 3-Ti nanometer biocomposites. Nanotechnology 15, 1465-1471 (2004)
162. 4V for biomedical applications. J. Mater. Sci. Mater. Med. 16, 379-385 (2005)
163. C. Liu, X. Li, F. Xu, P. M. Huang: Atomic force microscopy of soil inorganic colloids. Soil Sci. Plant Nutr. (Tokyo) 49, 17-23 (2003)
164. T. Hirono, M. Takahashi, W. Lin: Pore space visualization in unlithified sediments and rocks. Gensh Bakk Kenk. 8, 179-189 (2002)
165. A. Steele, D.T. Goddard, D. Stapleton, J.K. Toporski, V. Peters, V. Bassinger, G. Sharples, D.D. Wynn-Williams, D. McKay: Investigations into an unknown organism on the martian meteorite Allan Hills 84001. Meteorit. Planet. Sci. 35, 237-241 (2000)
166. A. Kempe, F. Jamitzky, W. Altermann, B. Baisch, T. Markert, W.M. Heckl: Discrimination of aqueous and aeolian paleoenvironments by atomic force microscopy-a database for the characterization of Martian sediments. Astrobiology 4, 51-64 (2004)
167. J. Xue, Y. Pan, G. Luo, H. Lu: Chemical components and microtopography of (100) surface for orthopyroxene. Chinese Sci. Bull. 48, 931-934 (2003)
168. M.P.S. Krekeler, S. Guggenheim, J. Rakovan: A microtexture study of palygorskite-rich sediments from the Hawthorne formation, Southern Georgia, by transmission electron microscopy and atomic force microscopy. Clays Clay Miner. 52, 263-274 (2004)
169. C. Marcos, I. Rodriguez, L.C. DeRenno, J.I. Paredes: Vermiculite surface structure as imaged by contact mode AFM. Europ. J. Mineral. 16, 597-607 (2004)
170. Y. Gio, Z. Pan, G. Song: Metamorphic plastic deformation origin of jadeite jade and its simulating synthesis. Guisuan. Tong. 20 (Suppl.), 4-8 (2001)
171. K. Henriksen, S.L.S. Stipp, J.R. Young, M.E. Marsh: Biological control of calcite crystallization: AFM investigation of coccolith polysaccharide function. Am. Miner. 89, 1709-1716 (2004)
172. P.J. Troy, H. Yuan, F.T. Mackenzie: Changes in surface morphology of calcite exposed to the oceanic water column. Aqua. Geochem. 3, 1-20 (1997)
173. P.A. Maurice, Y.J. Lee, L.E. Hersman: Dissolution of Al-substituted goethites by an aerobic Pseudomonas mendocina var. bacteria. Geochim. Cosmochim. Acta 64, 1363-1374 (2000)
174. A. Luettge: Crystal dissolution kinetics studied by vertical scanning interfer-ometry and Monte Carlo simulations. A brief review and outlook. Nanoscale Structure and Assembly at Solid-Fluid Interfaces 1, 209-247 (2004) (eds. X.Y. Liu, J.J. De Yoreo) Kluwer Academic Publishers, Norwell, MA. (2005)
175. M.A. Nugent, P. Maurice, S.L. Brantley: The field dissolution rate of feldspar in a Pennsylvania (USA) spodosol as measured by atomic force microscopy. Proceedings 9th International Symposium on Water-Rock Interaction, Taupo, N. Z. 387-390 (eds. G.B. Arehart, J.R. Hulston), Balkema Publ. Rotterdam, Neth. (1998)
176. H.H. Teng, P. Fenter, L. Cheng, N.C. Sturchio: Resolving orthoclase dissolution processes with atomic force microscopy and X-ray reflectivity. Geochem Cosmochim Acta 65, 3459-3474 (2001)
177. S.H. Sutheimer, P.A. Maurice, Q. Zhou: Dissolution of well-and poorly crystallized kaolinites: Al specification and effects of surface characteristics. Am. Miner. 84, 620-628 (1999)
178. 2. Electrochemistry (Tokyo) 67, 1234-1236 (1999)
179. K.D. Kepler, A.A. Gewirth: In situ AFM and STM investigation of electrochemical hydride growth on Ge(110) and Ge(111) surfaces. Surf. Sci. 303, 101-113 (1994)
180. Y.X. Zhou, R. Naguib, H. Fang, K. Salama: Development of cube textured Ni-W alloy tapes using powder metallurgy along with high energy ball milling for HTS coated conductors. Superconductor Sci. Technol. 17, 947-953 (2004)
181. K. Hanada, N. Nakayama, M. Mayuzumi, T. Sano, H. Takeishi: Tribological properties of Al-Si-Cu-Mg alloy-based composite-dispersing diamond nanocluster. Diamond and Related Materials 11, 749-752 (2002)
182. I. Calliari, M. Dabala, G. Brunoro, G.M. Ingo: Advanced surface techniques for characterization of Cu-based artifacts. J. Radioanal. Nucl. Chem. 247, 601-608 (2001)
183. T.M. Ko, W.C. Ng, W.T. Chen: Zincation treatments for electroless nickel under-bump metallurgy in the flip-chip packaging. Proc. Electrochem. Soc. 99-9, 340-351 (1999)
184. R. Ramanauskas: Structural factor in Zn alloy electrodeposit corrosion. Appl. Surf. Sci. 153, 53-64 (1999)
185. T.R. Yanez, Y. Houbaert: Characterisation of multiphase steel surface topography by atomic force microscopy. Sonderb. Praktisch. Metallograp. 32, 79-82 (2001)
186. K.H. Koch: Analysis and metallurgy. Part 2. CLB Chem Labor Biotech. 52, 128-133 (2001)
187. J. Flis: Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) and their application in corrosion studies. Ochr. Przed Koroz. 41, 34-39 (1998)
188. K. Minoshima, K. Komai: Nanometric visualization of localized damage by scanning probe microscopy. Mater. Sci. Res. Int. 2, 209-219 (1996)
189. H. Krawiec, V. Vignal, E. Finot, O. Heintz, R. Oltra, J.M. Olive: Local electrochemical studies after heat treatment of stainless steel. Role of induced metallurgical and surface modifications on pitting triggering. Metal. Mater. Trans. A 35, 3515-3521 (2004)
190. B. Schluter, G. Barkleit, F. Schneider, K. Mummert: Analysis of intergranular corrosion attack of stainless steels by means of atomic force microscopy and optical microscopy. Part 2: influence of impurity content. Mater. Corros. 51, 115-119 (2000)
191. L. Cretegny, A. Saxena: AFM characterization of the evolution of surface deformation during fatigue in polycrystalline copper. Acta Mater. 49, 3755-3765 (2001)
192. K. Kowal, J. DeLuccia, J.Y. Josefowicz, C. Laird, G.C. Farrington: Atomic force and scanning electron microscopy of corrosion and fatigue of an aluminum-copper alloy. Mater. Res. Soc. Symp. Proc. 409, 201-206 (1996)
193. K. Minoshima, Y. Oie, K. Komai: In situ AFM imaging system for the environmentally induced damage under dynamic loads in a controlled environment. ISIJ Int. 43, 579-588 (2003)
194. P.A. Zhdan, J.E. Castle: The corrosion of admiralty brass in ultra pure water measured by means of AFM and solution analysis. Proc. Electrochem. Soc. 2001-22, 822-834 (2001)
195. J.W. Schultze, B. Davepon, F. Karman, C. Rosenkranz, A. Schreiber, O. Voigt: Corrosion and passivation in nanoscopic and microscopic dimensions: The influence of grains and grain boundaries. Corr. Eng. Sci. Technol. 39, 45-52 (2004)
196. T. Martin, K.R. Hebert: Atomic Force Microscopy study of pit formation during anodic etching of aluminum. Proc. Electrochem. Soc. 99-27, 671-680 (1999)
197. J. Jakubowicz, H. Jungblut, H.J. Lewerenz: Initial surface topography changes during divalent dissolution of silicon electrodes. Electrochim. Acta 49, 137-146 (2003)
198. B. Mao, X. Cai, C. Shi, Z. Xie, J. Tang, Y. Chen, Z. Tian, Z. Tian: Application of electrochemical scanning probe microscopes in characterization and modification of solid-liquid interfaces. Fud Xueb., Zir. Kex. 38, 7-12 (1999)
199. J. Y. Josefowicz, L. Xie, G.C. Farrington: Observation of intermediate CuCl species during the anodic dissolution of Cu using atomic force microscopy. J. Phys. Chem. 97, 11995-11998 (1993)
200. E. Rocca, G. Bertrand, C. Rapin, J.C. Labrune: Inhibition of copper aqueous corrosion by non-toxic linear sodium heptanoate: mechanism and ECAFM study. J. Electroanalyt. Chem. 503, 133-140 (2001)
201. 4 Solution. Langmuir 13, 3557-3562 (1997)
202. M.U. Kamachi, Y. Katada: Electrochemical atomic force microscopic studies on passive films of nitrogen-bearing austenitic stainless steels. Electrochim. Acta 46, 3735-3742 (2001)
203. T.J. Mckrell, J.M. Galligan: Electrochemical atomic force microscopy study of the dissolution kinetics of 304 stainless steel. Mater. Res. Soc. Symp. Proc. 451, 549-554 (1997)
204. J. Romer, M. Plaschke, G. Beuchle, J.I. Kim: In situ investigation of U(IV)-oxide surface dissolution and remineralization by electrochemical AFM. J. Nucl. Mater. 322, 80-86 (2003)
205. J.P. Bearinger, C.A. Orme, J.L. Gilbert: Effect of hydrogen peroxide on titanium surfaces: in situ imaging and step-polarization impedance spectroscopy of commercially pure titanium and titanium, 6-aluminium, 4-vanadium. J. Biomed. Mater. Res. A 67, 702-712 (2003)
206. M.L. Occelli, S.A.C. Gould, G.D. Stucky: The study of the surface topography of microporous materials using atomic force microscopy. Stud. Surf. Sci. Catal. 84 Pt.A, 485-492 (1994)
207. M.L. Occelli, S.A.C. Gould, B. Drake: Atomic force microscopy examination of the topography of a fluid cracking catalyst surface. ACS Symp. Ser. 571, 271-293 (1994)
208. M.L. Occelli, S.A.C. Gould: The use of atomic force microscopy (AFM) to study the surface topography of commercial fluid cracking catalysts (FCCs) and pillared interlayered clays (PILCs) cracking catalysts. Stud. Surf. Sci. Catalysis 149, 71-104 (2004)
209. Y.M. Li, Z.C. Chen, D.S. Lu, X.F. Lin: Topography and electro-catalysis property of horseradish peroxidase assembly active film. Wuli Huaxue Xuebao 19, 474-477 (2003)
210. T. Nakagawa: Scanning probe microscope for DNA sequence determination. Jpn. Kokai Tok. Koho JP 06289017 A2 (1994)
211. J. Vesenka, E. Morales: Scanning probe microscopy in biology with potential applications in forensics. Proceedings of the 3rd Symposium Atomic Force/Scanning Tunneling Microscopy, Baltimore, May 9-12, 1998, 31-48, Publisher Kluwer Academic, New York (1999)
212. J.R. Smith: A quantitative method for analyzing AFM images of the outer surfaces of human hair. J. Microsc. 191, 223-228 (1998)
213. S.P. Gurden, V.F. Monteiro, E. Longo, M.M.C. Ferreira: Quantitative analysis and classification of AFM images of human hair. J. Microsc. 215, 13-23 (2004)
214. R.L. McMullen, S.P. Kelty: Investigation of human hair fibers using lateral force microscopy. Scanning 23, 337-345 (2001)
215. S. Kasas, A. Khanmy-Vital, G. Dietler: Examination of line crossings by atomic force microscopy. Forensic Sci. Internat. 119, 290-298 (2001)
216. M. D'Uffizi, G. Falso, G.M. Ingo, G. Padeletti: Microchemical and micromor-phological features of gunshot residue observed by combined use of AFM, SA-XPS and SEM + EDS. Surf. Interf. Anal. 34, 502-506 (2002)
217. J. Sharma, J.P. Teter, R.J. Abbundi, N.A: Guardala. Determination of radiation exposure history of common materials and computer hardware by using atomic (and magnetic) force microscopy. Appl. Phys. Lett. 82, 2236-2238 (2003)
218. A. Kempe, J.W. Schopf, W. Altermann, A.B. Kudryavtsev, W.M. Heckl: Atomic force microscopy of Precambrian microscopic fossils. Proc. Nat. Acad. Sci. USA 99, 9117-9120 (2002)
219. R. Avci, M.H. Schweitzer, R.D. Boyd, J.L. Wittmeyer, F.T. Arce, J.O. Calvo: Preservation of bone collagen from the late cretaceous period studied by immunological techniques and atomic force microscopy. Langmuir 21, 3584-3590 (2005)
220. K.D. Jandt, M. Finke, P. Cacciafesta: Aspects of the physical chemistry of polymers, biomaterials and mineralized tissues investigated with atomic force microscopy (AFM). Coll. Surf. B 19, 301-314 (2000)
221. C.Z. Fan, S. Minoru, I. Miyoshi, A. Tadahiro, M. Mitsuo, A. Ishikawa, Y.S. Wu, Z.C. Li: Analyses of composition and structure on the ancient bronze black mirror "Hei-Qi-Gu" and search into the treating process of its surface layer. Sci. China, Ser. B 37, 1421-1428 (1994)
222. V.A. Zazhigalov, S.I. Klimovskii, V.V. Strelko, A.V. Zazhigalov, A. Kowal: Structure and morphology of the surface of glazes from ancient, Kiev Vizantia. Dopovidi Natsional'noi Akademii Nauk Ukraini 120-124 (2001)
223. Chem. Abstr. 137, 93303 (2002)
224. M. Schreiner, G. Woisetschlager, I. Schmitz, M. Wadsak: Characterization of surface layers formed under natural environmental conditions on medieval stained glass and ancient copper alloys using SEM, SIMS and atomic force microscopy. J. Anal. Atom. Spectrom. 14, 395-403 (1999)
225. J. Roque, T. Pradell, J. Molera, M. Vendrell-Saz: Evidence of nucleation and growth on metal Cu and Ag nanoparticles in lustre: AFM surface characterization. J. Non-Cryst. Solids 351, 568-575 (2005)
226. D. Courjon, J.M. Vigoureux, M. Spajer, K. Sarayeddine, S. Leblanc: External and internal reflection near field microscopy: experiments and results. Appl. Opt. 29, 3734-3740 (1990)
227. M. Spajer, D. Courjon, K. Sarayeddine, A. Jalocha, J.M. Vigoureux: Micro-scopie en champ proche par reflexion. J. Phys. (Paris) Ser. III 1, 1-12 (1991)
228. V. Sandoghdar, S. Wegscheider, G. Krausch, J. Mlynek: Reflection scanning near-field microscopy with uncoated fiber tips: How good is the resolution really? J. Appl. Phys. 81, 2499-2503 (1997)
229. G. Kaupp: Supermicroscopy in Supramolecular Chemistry: AFM, SNOM, and SXM, in Comprehensive Supramolecular Chemistry, (eds. J.E.D. Davies, J.A.Ripmeester), Vol. 8, 381-423 + 21 color plates, Elsevier, Oxford (1996)
230. G. Kaupp, A. Herrmann, M. Haak: Near-Field Optical Microscopy with Un-coated Tips: Calibration, Chemical Contrast on Organic Crystals, and Photolithography. J. Vac. Sci.Technol. B 15, 1521-1526 (1997)
231. G. Kaupp, A. Herrmann: Chemical contrast in scanning near-field optical microscopy. J. Phys. Org. Chem. 10, 675-679 (1997)
232. G. Kaupp, A. Herrmann: SNOM by near-field reflectance enhancement: a versatile and valid technique. J. Phys. Org. Chem. 11, 141-143 (1998)
233. G. Kaupp, A. Herrmann, M. Haak: SNOM (scanning near-field optical microscopy), a genuine photochemical technique. Internet Photochem. Photobiol., Available from http://www.photobiology.com/IUPAC98/page2.htm (1998)
234. G. Kaupp, A. Herrmann, M. Haak: Artifacts in topography and scanning near-field optical microscopy (SNOM) due to deficient tips. J. Phys. Org. Chem. 12, 797-807 (1999)
235. U.C. Fischer: Scanning near-field optical microscopy, in Scanning Probe Microscopy, (ed. R. Wiesendanger), Springer, Berlin Heidelberg, New York, 161-210 (1998)
236. A.H. La Rosa, B.I. Yakobson, H.D. Hallen: Origins and effects of thermal processes on near-field optical probes. Appl. Phys. Lett. 67, 2597-2599 (1995)
237. M. Staehelin, M.A. Bopp, G. Tarrach, A.J. Meixner, I. Zschokke-Graenacher: Temperature profile of fiber tips used in scanning near-field optical microscopy. Appl. Phys. Lett. 68, 2603-2605 (1996)
238. G. Kaupp, A. Herrmann: Positive submicron lithography using uncoated or far-field apertured SNOM tips on organic crystals. Ultramicroscopy 71, 383-388 (1998)
239. D. Zeisel, S. Nettesheim, B. Dutoit, R. Zenobi: Pulsed laser-induced desorption and optical imaging on a nanometer scale with scanning near-field microscopy using chemically etched fiber tips. Appl. Phys. Lett. 68, 2491-2492 (1996)
240. A. Naber, H.-J. Maas, K. Razavi, U.C. Fischer: Dynamic force distance control suited to various probes for scanning near-field optical microscopy. Rev. Sci. Instrum. 70, 3955-3961 (1999)
241. S. Kühn, C. Hettich, C. Schmitt, J.P. Poizat, V. Sandoghdar: Diamond colour centres as a nanoscopic light source for scanning near-field optical microscopy. J. Microsc. 202, 2-6 (2001)
242. N. Chevalier, M.J. Nasse, J.C. Woehl, P. Reiss, J. Bleuse, F. Chandezon, S. Huant: CdSe single-nanoparticle based active tips for near-field optical microscopy. Nanotechnology 16, 613-618 (2005)
243. M. Labardi, P.G. Gucciardi, M. Allegroni: Near-field optical microscopy. Riv. Nuov. Cim. 23/24 1-35 (2000)
244. R.C. Reddick, R.J. Warmack, T.L. Ferrel: New form of scanning optical microscopy. Phys. Rev. B 39, 767-770 (1989)
245. S. Aubert, A. Bruyant, S. Blaize, R. Bachelot, G. Lerondel, S. Hudlet, P. Royer: Analysis of the interferometric effect of the background light in aper-tureless scanning near-field optical microscopy. J. Opt. Soc. Am. B 20, 2117-2124 (2003)
246. H. Brückl, H. Pagnia, N. Sotnik: Optical near-field characterization of submi-cron structured silicon films. Scanning 17, 24-27 (1995)
247. F. Zenhausen, M.P. O'Boyle, H.K. Wickramasinghe: Apertureless near-field optical microscope. Appl. Phys. Lett. 65, 1623-1625 (1994)
248. F. Zenhausen, Y. Martin, H.K. Wickramasinghe: Scanning interferometric apertureless microscopy: optical imaging at 10 Angstrom resolution. Science 269, 1083-1085 (1995)
249. B. Knoll, F. Keilmann: Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy. Opt. Commun. 182, 321-328 (2000)
250. F. Keilmann, R. Hillenbrand. Near-field microscopy by elastic light scattering from a tip. Philos. Trans. R. Soc. London, Ser. A 362, 787-805 (2004)
251. A. Kramer, W. Trabesinger, B. Hecht, U.P. Wild: Optical near-field enhancement at a metal tip probed by a single fluorophore. Appl. Phys. Lett. 80, 1652-1654 (2002)
252. S.A. Vickery, R.C. Dunn: Scanning near-field fluorescence resonance energy transfer microscopy. Biophys. J. 76, 1812-1818 (1999)
253. G. Carbone, B. Zappone, R. Barberi, R. Bartolino: Apertureless SNOM microscopy on a commercial AFM. Mol. Cryst. Liq. Cryst. 372, 373-382 (2001)
254. R. Hillenbrand, F. Keilmann, P. Hanarp, D.S. Sutherland, J. Aizpurua: Coherent imaging of nanoscale plasmon patterns with a carbon nanotube optical probe. Appl. Phys. Lett. 83, 368-370 (2003)
255. H. T. Chen, S. Kraatz, G.C. Cho, R. Kersting: Identification of a resonant imaging process in apertureless near-field microscopy. Phys. Rev. Lett. 93, 267401-1-267401-4 (2004)
256. S. Patane, P.G. Gucciardi, M. Labardi, M. Allegroni: Apertureless near-field optical microscopy. Riv. Nuo. Cim. 27, 1-46 (2004)
257. W.-X. Sun, Z.-X. Shen: Optimizing the near-field around silver tips. J. Opt. Soc. Am. A 20, 2254-2259 (2003)
258. M. Schüttler, M. Leuschner, M. Lippitz, W. Rohle, H. Giessen: Towards the origin of the shear force in near-field microscopy. Jpn. J. Appl. Phys. 40, 813-818 (2001)
259. C. Adelmann, J. Hetzler, G. Scheiber, T. Schimmel, M. Wegener, H.B. Weber, H. v. Löhneysen: Experiments on the depolarization near-field scanning optical microscope. Appl. Phys. Lett. 74, 179-181 (1999)
260. S. Madsen, T. Olesen, J.H. Hvam: Surface modifications via photo-chemistry in a reflection scanning near-field optical microscope. Optics at the nanometer scale: imaging and storing with photonic near fields, NATO ASI Series E, Appl. Sci. 319, 263-275 (1996)
261. G. v. Freymann, T. Schimmel, M. Wegener: Computer simulations: subwave-length resolution with an apertureless SNOM: Appl. Phys. A 66, S939-S942 (1998)
262. B. Hecht, H. Bielefeldt, Y. Inouye, L. Novotny, D. W. Pohl: Facts and artifacts in near-field optical microscopy. J. Appl. Phys. 81, 2492-2498 (1997)
263. S. Madsen, S. I. Bozhevolnyi, J. M. Hvam: Sub-wavelength imaging by depolarization in a reflection near-field optical microscope using an uncoated fiber probe. Opt. Commun. 146, 277-284 (1998)
264. G. Kaupp, A. Herrmann, G. Wagenblast: Scanning near-field optical microscopy (SNOM) with uncoated tips. Proc. SPIE-Int. Soc. Opt. Eng. 3607, 16-25 (1999); Available from http://kaupp.chemie.uni-oldenburg.de/spie/
265. G. Kaupp: Optische Nahfeldmikroskopie auf rauhen Oberflächen mit Glasfaser-spitzen in Kreuzpolarisation. Forschungsbericht des Bundesministeriums für Bildung und Forschung (BMBF), FKZ 13N7640/3, 25.3.2003, pp. 1-24 (2003)
266. J. Koglin, U.C. Fischer, H. Fuchs: Material contrast in scanning near-field optical microscopy at 1-10 nm resolution. Phys. Rev. B 55, 7977-7984 (1997)
267. U.C. Fischer, J. Heimel, H.J. Maas, M. Hartig, S. Höppener, H. Fuchs: Latex bead projection nanopatterns. Surf. Interface Anal. 33, 75-80 (2002)
268. A. Jalocha, N. F. van Hulst: Dielectric and fluorescent samples imaged by scanning near-field optical microscopy in reflection. Opt. Commun. 119, 17-22 (1995)
269. N. F. Van Hulst, M. H. P. Moers, B. Bölger: Near-field optical microscopy in transmission and reflection modes in combination with force microscopy. J. Microsc. 171, 95-105 (1993)
270. S.I. Bozhevolnyi, I.I. Smolyaninov, O. Keller: Correlation between optical and topographical images from an external reflection near-field microscope with shear force feedback: Appl. Opt. 34, 3793-3799 (1995); etched fibers were used in that report
271. R.L. Williamson, L.J. Brereton, M. Antognozzi, M.J. Miles: Are artifacts in scanning near-field optical microscopy related to misuse of shear force? Ultra-microscopy 71, 165-175 (1998)
272. T. Hartmann, G. Gatz, W. Wiegräbe, A. Kramer, A. Hillebrand, K. Lieberman, W. Baumeister, R. Guckenberger, in Near-Field Optics, (eds. D.W. Pohl, D. Courjon). Kluwer, Netherlands, p. 33 (1993)
273. Y. Martin, F. Zenhausern, H.K. Wickramasinghe: Scattering spectroscopy of molecules at nanometer resolution. Appl. Phys. Lett. 68, 2475-2477 (1996)
274. S. I. Bozhevolnyi, B. Vohnsen: Near-field optics with uncoated fiber tips: light confinement and spatial resolution. J. Opt. Soc. Am. B 14, 1656-1663 (1997)
275. S. I. Bozhevolnyi: Topographical artifacts and optical resolution in near-field optical microscopy. J. Opt. Am. B 14, 2254-2259 (1997)
276. G. Kaupp, M. Haak: Phase rebuilding of α-cinnamic acid in tail irradiations. Mol. Cryst. Liq. Cryst. 313, 193-198 (1998)
277. G. Kaupp, M. Haak, A. Herrmann: Chemical SNOM-contrast on organic solids using cold fiber tips. Lecture at the 4th Near-Field Optics, Conference, Jerusalem (1997); Book of Abstracts, p. 92 (1997)
278. G. Kaupp, A. Herrmann: Waste-free quantitative gas/solid diazotization using nitrogen dioxide and triazene synthesis, both avoiding liquid phases. J. Prakt. Chem./Chem.-Ztg. 339, 256-260 (1997)
279. G. Kaupp, J. Schmeyers, M. Haak, T. Marquardt, A. Herrmann: AFM in solid state reactions. Mol. Cryst. Liq. Cryst. 276, 315-337 (1996)
280. G. Kaupp: Supermikroskopie bei organischen Kristallreaktionen. Chemie in unserer Zeit 31, 129-139 (1997); Engl. translation in http://kaupp.chemie.uni- oldenburg.de
281. G. Kaupp, A. Herrmann: Chemical contrast in scanning near-field optical microscopy. J. Phys. Org. Chem. 10, 657-659 (1997)
282. G. Kaupp: Organic solid-state reactions with 100% yield, Top. Curr. Chem. 254, 95-183 (2005)
283. G.M.J. Schmidt: Photodimerization in the solid state. Pure Appl. Chem. 27, 647-678 (1971)
284. G. Kaupp, A Herrmann, J. Schmeyers: Waste-free chemistry of diazonium salts and benign separation of coupling products in solid salt reactions. Chem. Eur. J. 8, 1395-1406 (2002)
285. G. Kaupp, A. Herrmann, J. Schmeyers, J. Boy: SNOM a new photophysical tool. J. Photochem. Photobiol. A: Chemistry 139, 93-96 (2001)
286. G. Kaupp, A. Herrmann, M.R. Naimi-Jamal, S. Stepanenko, V. Stepanenko: Nahfeldmikroskopie für organische und biologische Oberflächen, Forschungs-bericht des Bundesministeriums für Bildung und Forschung (BMBF), FKZ 13N7519, 30.6.2003, pp. 1-33 (2003)
287. L.F. Garfias, D.J. Siconolfi: In situ high-resolution microscopy on duplex stainless steels. Proc. Electrochem. Soc. 99-28, 89-103 (2000)
288. E. Teixeira-Neto, G. Kaupp, F. Galembeck: Latex particle heterogeneity and clustering films. J. Phys. Chem. B 107, 14255-14260 (2003)
289. E. Teixeira-Neto, G. Kaupp, F. Galembeck: Spatial distribution of serum solutes on dry latex sub-monolayers determined by SEPM, SNOM, SC microscopy. Coll. Surfaces, A: Physicochem. Eng. Aspects 243, 79-87 (2004)
290. W. Hevers, H. Stieve: Ultrastructural changes of the microvillar cytoskeleton in the photoreceptor of crayfish Orconectes limosus related to different adaptation conditions. Tissue Cell 27, 405-419 (1995)
291. D.A. Smith, S. Webster, M. Ayad, S.D. Evans, D. Fogherty, D. Batchelder: Development of a scanning near-field optical probe for localized Raman spec-troscopy. Ultramicroscopy 61, 247-252 (1995)
292. S. Webster, D.N. Batchelder, D.A. Smith: Submicron resolution measurement of stress in silicon by near-field Raman spectroscopy. Appl. Phys. Lett. 72, 1478-1480 (1998)
293. R.M. Stöckle, Y.D. Suh, V. Deckert, R. Zenobi: Nanoscale chemical analysis by tip-enhanced Raman spectroscopy. Chem. Phys. Lett. 318, 131-136 (2000)
294. R.M. Stöckle, V. Deckert, C. Fokas, D. Zeisel, R. Zenobi: Sub-wavelength Raman spectroscopy on isolated silver islands. Vibr. Spectrosc. 22, 39-48 (2000)
295. V. Deckert, D. Zeisel, R. Zenobi: Near-field surface-enhanced Raman imaging of dye-labeled DNA with 100-nm resolution. Anal. Chem. 70, 2646-2650 (1998)
296. C.A. Michaels, C.E.J. Dentinger, L.J. Richter, D.B. Chase, R.R. Cavanagh, S.J. Stranick: Assessment of sensitivity advances in near-field Raman spectroscopy. Proc. SPIE 4098, 152-159 (2000)
297. M.S. Anderson: Locally enhanced Raman spectroscopy with an atomic force microscope. Appl. Phys. Lett. 76, 3130-3132 (2000)
298. N. Hayazawa, Y. Inouye, Z. Sekkat, S. Kawata: Near-field Raman imaging of organic molecules by an apertureless metallic probe scanning optical microscope. J. Chem. Phys. 117, 1296-1301 (2002)
299. A. Hartschuh, E.J. Sanchez, X.S. Xie, L. Novotny: High-resolution near-field Raman microscopy of single-walled carbon nanotubes. Phys. Rev. Lett. 90, 095503-1-095503-4 (2003)
300. H.M. Poolock, D.A. Smith: The use of near-field probes for vibrational spec-troscopy and photothermal imaging. In Handbook of Vibrational Spectroscopy, Vol. 2 (eds. J.M. Chalmers, P.R. Griffiths) Wiley, Chichester, 1472-1491 (2002)
301. C.A. Michaels, L.J. Richter, R.R. Cavanagh, S.J. Stranick: Chemical imaging with scanning near-field infrared microscopy and spectroscopy. Proc. SPIE-Int. Soc. Opt. Eng. 4089, 102-109 (2000)
302. S.J. Stranick, D.B. Chase, C.A. Michaels: Near-field microscopies for chemical and material analysis on the nanoscale. Polym. Mater. Sci. Eng. 87, 172 (2002)
303. C.A. Michaels, X. Gu, D.B. Chase, S.J. Stranick: Near-field infrared imaging and spectroscopy of a thin film polystyrene/poly(ethyl acrylate) blend. Appl. Spectrosc. 58, 257-263 (2004)
304. S.J. Stranick, S.A. Buntin, C.A. Michaels: Scanning near-field dielectric microscopy at microwave frequencies for materials characterization. Polym. Mater. Sci. Eng. 88, 142 (2003)
305. E.J. Sanchez, L. Novotny, X.S. Xie: Near-field fluorescence microscopy based on two-photon excitation with metal tips. Phys. Rev. Lett. 82, 4014-4017 (1999)
306. M. Labardi, M. Allegrini, M. Zavelani.Rossi, D. Polli, G. Cerullo, S. DeSilvestri, O. Svelto: Highly efficient second-harmonic nanosource for near-field optics and microscopy. Opt. Lett. 29, 62-64 (2004)
307. A. Bouhelier, M.R. Beversluis, L. Novotny: Application of field-enhanced near-field optical microscopy. Ultramicroscopy 100, 413-419 (2004)
308. A. Kelch, S. Wessel, T. Will, U. Hintze, R. Werpf, R. Wiesendanger: Penetration pathways of fluorescent dyes in human hair fibres investigated by scanning near-field optical microscopy. J. Microsc. 200, 179-186 (2001)
309. V. Subramaniam, A.K. Kirsch, R.V. Rivera-Pomar, T.M. Jovin: Scanning near-field optical microscopy and microspectroscopy of green fluorescent protein in intact Escherichia coli bacteria: J. Fluorescence 7, 381-385 (1997)
310. P. Nagy, A. Jenei, A.K. Kirsch, J. Szöllösi, S. Damjanovich: Activation-dependent clustering of the erB2 receptor tyrosine kinase detected by scanning near-field optical microscopy. J. Cell Sci. 112, 1733-1741 (1999)
311. A.K. Kirsch, V. Subramaniam, G. Striker, C. Schnetter, D. Arndt-Jovin, T.M. Jovin: Continuous wave two-photon scanning near-field optical microscopy. Biophys. J. 75, 1513-1521 (1998)
312. A. Jenei, A.K. Kirsch, V. Subramaniam, D. Arndt-Jovin, T.M. Jovin: Picosecond multiphoton scanning near-field optical microscopy. Biophys. J. 76, 1092-1100 (1999)
313. A.K. Kirsch, V. Subramaniam, A. Jenei, T.M. Jovin: Fluorescence resonance energy transfer detected by scanning near-field optical microscopy. J. Microsc. 194, 448-454 (1999)
314. S. Hosaka: Possibility of SNOM-based storage and J. Tominaga: Super density optical data storage by near-field optics, Chapters 13.5 and 14 in Applied Scanning Probe Methods (ed. B. Bushan, H. Fuchs, S. Hosaka), Springer, Berlin Heidelberg, New York, pp. 414ff and 429ff (2004)
315. 2. Appl. Phys. Lett. 71, 1-3 (1997)
316. E. Betzig, J.K. Trautman, R. Wolfe, E.M. Gyorgy, P.L. Finn, M.H. Kryder, C.H. Chang: Near-field magnetooptics and high density data storage. Appl. Phys. Lett. 61, 142-144 (1992)
317. A. Tarun, M.R.H. Daza, N. Hayazawa, Y. Inouye, S. Kawata: Apertureless optical near-field fabrication using an atomic force microscope on photoresists: Appl. Phys. Lett. 80, 3400-3402 (2002)
318. P. Royer, D. Barchiesi, G. Lerondel, R. Bachelot: Near-field optical patterning and structuring based on local-field enhancement at the extremity of a metal tip. One contribution of 13 to a Theme 'Nano-optics and near-field microscopy'. Philos. Trans. Math., Phys. Eng. Sci. 362, 821-842 (2004)
319. X. Yin, N. Fang, X. Zhang, I.B. Martini, B.J. Schwartz: Near-field two-photon nanolithography using an apertureless optical probe. Appl. Phys. Lett. 81, 3663-3665 (2002)
320. H.J. Mamin, D. Rugar: Thermal writing using a heated atomic force microscope tip. Appl. Phys. Lett. 69, 433 (1996)
321. G. Kaupp: Photodimerization of Anthracenes in the solid state: New results from atomic force microscopy. Angew. Chem. Int. Ed. Engl. 31, 595-598 (1992)
322. G. Kaupp, M. Kaupp: Advanced fullerene-type texture and further features of the macadamia nutshell as revealed by optical 3D microscopy. J. Microsc., submitted
323. V.M. Shalaev, W. Cai, U.K. Chettiar, H.K. Yuan, A.K. Sarychev, V.P. Drachev, A.V. Kildishev: Negative index of refraction in optical meta-materials. Optics Lett. 30, 3356-3358 (2005)
324. A.C. Fischer-Cripps: Nanoindentation, Mechanical Engineering Series. Springer, New York (2002)
325. O.L. Warren, J.F. Graham, P.R. Norton: Tapping mode imaging with an inter-facial force microscope. Rev. Sci. Instrum. 68, 4124-4131 (1997)
326. O.L. Warren, S. A. Downs, T.J. Wyrobek: Challenges and interesting observations associated with feed-back-controlled nanoindentation. Z. Metallkd. 95, 287-296 (2004)
327. H. Meinhard, P. Grau, G. Berg, S. Mosch: Hardness and flow behavior of glass in the nanometer range. An interpretation of the load dependence of the hardness. Glass Sci. Technol. 70, 333-339 (1997)
328. H. Hertz: Uber die Berührung fester elastischer Körper. J. Reine Angew. Math. 92, 156-171 (1882)
329. I.N. Sneddon: The relation between load and penetration in the axisymmetric Boussinesq problem for a punch of arbitrary profile. Int. J. Eng. Sci. 3, 47-57 (1965)
330. G. Kaupp, M.R. Naimi-Jamal: Nanoscratching on surfaces: the relationships between lateral force, normal force and normal displacement. Z. Metal. 95, 297-305 (2004)
331. T. Chudoba, F. Richter: Investigation of creep behaviour under load during indentation experiments and its influence on hardness and modulus results. Surf. and Coat. Technol. 148, 191-198 (2001)
332. M.R. Naimi-Jamal, G. Kaupp: Quantitative evaluation of nanoindents: Do we need more reliable mechanical parameters for the characterization of materials? Z. Metallkd. 96, 1226-1236 (2005)
333. S.E. Bresler, S.N. Zhurkov, E.N. Kazbekov, E.M. Saminskii, E.E. Tomashevskii; Investigation of macroradicals arising during mechanical destruction of polymers. Zhurnal Sakharnoi Promyshlennosti 29, 358-364 (1959).
334. Chem. Abstr. 108586 (1959)
335. B. Wolf, A. Richter, M. Günther: Approaches of quantifying the entire load-depth curve in terms of hardness. Z. Metal. 94, 807-812 (2003)
336. G. Y. Chin, M.L. Green, L.G. Van Uitert, W.A. Hargreaves: Hardness anisotropy of strontium fluoride, barium fluoride, sodium chloride, and silver chloride crystals. J. Mater. Sci 8, 1421-1425 (1973)
337. H. Li, R.C. Bradt: The microhardness indentation size-load effect (ISE) in hard ceramic materials. J. Hard Metals 3, 403-419 (1992)
338. T.Y. Tsui, W.C. Oliver, G.M. Pharr: Indenter geometry effects on the measurement of mechanical properties by nanoindentation with sharp indenters. Mater. Res. Soc. Symp. Proc. 436, 147-152 (1997)
339. M.I. Petrescu. A possible interpretation of the exponent in the Meyer Law for microhardness in a group of sulfidic minerals. U. P. B. Sci. Bull. Series B 63, 51-56 (2001)
340. K. Herrmann, N.M. Jennett, S. Kuypers, I. McEntegaart, C. Ingelbrecht, U. Hangen, T. Chudoba, F. Pohlenz, F. Menelao: Investigation of the properties of candidate reference materials suited for the calibration of nanoindentation instruments. Z. Metal. 94, 802-806 (2003)
341. T. Chudoba: Depth sensing hardness measurements. A new model for the interpretation of results. Materialprüfung 39, 357-361 (1997)
342. K.M. McElhaney, J.J. Vlassak, W.D. Nix: Determination of indenter tip geometry and indentation contact area for depth-sensing indentation experiments. J. Mater. Res. 13, 1300-1306 (1998)
343. A Bolshakov, G. M. Pharr: Influences of pileup on the measurement of mechanical properties by load and depth sensing indentation techniques. J. Mater. Res. 13, 1049-1058 (1998)
344. W.C. Oliver, G.M. Pharr: An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments. J. Mater. Res. 7, 1564-1583 (1992)
345. TriboScope Users Manual of Hysitron Inc. (1999)
346. G.M. Pharr, W.C. Oliver, F.R. Brotzen: On the generality of the relationship among contact stiffness, contact area, and elastic modulus during indentation. J. Mater. Res. 7, 613-617 (1992)
347. B. Wolf, C. Deus, P. Paufler: Comparative morphology study of indentations in quasicrystalline AlPdMn and single crystalline NiAl investigated by atomic force microscopy. Surf. Interf. Anal. 25, 561-568 (1997)
348. M. Kempf, M. Goeken, H. Vehoff: Nanohardness measurements for studying local mechanical properties of metals. Appl. Phys. A: A66, 843-846 (1998)
349. B. Bhushan: Nanotribology and its applications to magnetic storage devices and MEMS. NATO ASI Ser., Ser. E286, 367-395 (1995)
350. J. Thurn, R.F. Cook: Simplified area function for sharp indenter tips in depth-sensing indentation. J. Mater. Res. 17, 1143-1146 (2002)
351. K. Herrmann, N.M. Jennett, W. Wegener, J. Meneve, K. Hasche, R. Seeman: Progress in determination of indenters used for nanoindentation. Thin Solid Films 377-378, 394-400 (2000)
352. N.M. Jennett, A.S. Maxwell, K. Lawrence, L.N. McCartney, R. Hunt, J. Kosk-inen, J. Meneve, W. Wegener, T. Muukkonen, F. Rossi, N. Gibson, Z. Xu, A.J. Bushby, S. Brookes, A. Cavaleiro, K. Herrmann, B. Bellaton, R. Consiglio, F. Augereau, O. Kolosov, D. Schneider, T. Chudoba: Indicoat Final Report: Determination of Hardness and Modulus of thin Films and Coatings by Nanoin-dentation. NPL Report MATC (A) 24 (2001)
353. T.Y. Tsui, W.C. Oliver, G.M. Pharr: Nanoindentation of soft films on hard substrates: The importance of pile-up. Mate. Res. Soc. Symp. Proc. Vol 436, 207-212 (1997)
354. B. Bhushan (Ed.), Springer Handbook of Nanotechnology, Chapter 22.4, pp. 707-711, Springer, Berlin (2004)
355. S.V. Hainsworth, H.W. Chandler, T.F. Page: Analysis of nanoindentation load-displacement loading curves. J. Mater. Res. 11, 1987-1995 (1996)
356. S.V. Hainsworth, T.F. Page: Mechanical property data for coated systems-the prospects for measuring "coating only" properties using nanoindentation. Mater. Res. Symp. Proc., Maters. Res. Soc. 436, 171-176 (1997)
357. T.F. Page, G.M. Pharr, J.C. Hay, W.C. Oliver, B.N. Lucas, E. Herbert, L. Riester: Nanoindentation characterization of coated systems: P: S2-a new approach using the continuous stiffness technique. Mater. Res. Soc. Symp. Proc. 522, 53-64 (1998)
358. J.L. Loubet, J.M. Georges, J. Meille: In Microindentation Techniques in Materials Science & Engineering, (Eds. P.J. Blau, B.R. Lawn) ASTM, Philadelphia, pp. 72-89 (1986)
359. K. Zeng, C.H. Chiu: An analysis of load-penetration curves from instrumented indentation. Acta Mater. 49, 3539-3551 (2001)
360. M.T. Attaf: A unified aspect of power-law correlations for Berkovich hardness testing of ceramics. Mater. Lett. 57, 4627-4638 (2003)
361. M. Sakai: The Meyer hardness: a measure for plasticity? J. Mater. Res. 14, 3630-3639 (1999)
362. J.L. Hay, W.C. Oliver, A. Bolshakov, G.M. Pharr: Using the ratio of loading slope and elastic stiffness to predict pile-up and constraint factor during indentation. Mater. Res. Soc. Symp. Proc.Vol. 522, 101-106 (1998)
363. T. Chudoba: Interpretation of depth sensing hardness measurements. Forschungszentrum Rossendorf e. V., Bericht FRZ-129, 49-53 (1996)
364. K. Trachenko, M. Dove: Intermediate state in pressurized silica glass: Reversibility window analogue. Phys. Rev. B 67 212203/1-212203/3 (2003)
365. R. Ahuja, S. Rekhi, B. Johansson: Theoretical prediction of a phase transition in gold. Phys. Rev. B63 212101/1-212101/3 (2001)
366. U.D. Hangen: A comparison of nano-hardness and scratch resistance on Mohs minerals. Z. Metallkd. 92, 1074-1077 (2001)
367. N.A. Stilwell, D. Tabor: Elastic recovery of conical indentations. Proc. Phys. Soc. London 78, 169-179 (1961)
368. Matthes: Mineralogie (3). Springer, Berlin, p. 55 (1990)
369. 3) observed under shock compression. Geophysical Research Letters 27, 2021-2024 (2000)
370. A. Kailer, K.G. Nickel, Y.G. Gogotsi: Raman microspectroscopy of nanocrys-talline and amorphous phases in hardness indentations. J. Raman Spectr. 30, 939-946 (1999)
371. M. Sakai: Energy principle of the indentation-induced inelastic surface deformation and hardness of brittle materials., Acta Metall. Mater. 41, 1751-1758 (1993)
372. J.R. Tuck, A. M. Korsunsky, S. J. Bull, R. I. Davidson: On the application of the work-of-indentation approach to depth-sensing indentation experiments in coated systems. Surf. and Coati. Technol., 137, 217-224 (2001)
373. Y.T. Cheng, C.M. Cheng: Relationships between hardness, elastic modulus, and the work of indentation. Appl. Phys. Lett. 73, 614-616 (1998)
374. Y.T. Cheng, Z. Li, C.M. Cheng: Scaling relationships for indentation measurements. Philos. Mag. A 82, 1821-1829 (2002)
375. J. Malzbender: Energy dissipated during spherical indentation. J. Mater. Res. 19, 1605-1607 (2004)
376. W. Ni, Y.T. Cheng, C.M. Cheng, D.S. Grummon: An energy-based method for analyzing instrumented spherical indentation experiments. J. Mater. Res. 19, 149-157 (2004)
377. C.L. Kelchner, S.J. Plimpton, J.C. Hamilton: Dislocation nucleation and defect structure during surface indentation. Phys. Rev. B 58, 11085-11088 (1998)
378. J.A. Zimmerman, C.L. Kelchner, P.A. Klein, J.C. Hamilton, S.M. Foiles: Surface step effects on nanoindentation. Phys. Rev. Lett. 87, 165507/1-165507/4 (2001)
379. K.J. Van Vliet, J. Li, T. Zhu, S. Yip, S. Suresh: Quantifying the early stages of plasticity through nanoscale experiments and simulations. Phys. Rev. B 67, 104105/1-104105/15 (2003)
380. For example A. Muliana, R. Steward, R.M. Haj-Ali, A. Safena: Artificial neural network and finite element modeling of nanoindentation tests. Metal. Mater. Trans. A: 33, 1939-1947 (2002)
381. J.D. Kiely, R.Q. Hwang, J.E. Houston: Effect of surface steps on the plastic threshold in nanoindentation. Phys. Rev. Lett. 81, 4424-4427 (1998)
382. J.D. Kiely, J.E. Houston: Nanomechanical properties of Au (111), (001), and (110) surfaces. Phys. Rev. B 57, 12588-12594 (1998)
383. J.D. Kiely, K.F. Jarausch, J.E. Houston, P.E. Russell: Initial stages of yield in nanoindentation. J. Mater. Res. 14, 2219-2227 (1999)
384. G. Kaupp, J. Schmeyers, U.D. Hangen: Anisotropic molecular movements in organic crystals by mechanical stress. J. Phys. Org. Chem. 15, 307-313 (2002)
385. L.A.Walker, K. Folting, L.L. Merritt: Crystal structure of 2-thiohydantoin. Acta Crystallogr. Sect. B 25, 88-93 (1969)
386. G. Kaupp, J. Schmeyers: Gas/Solid Reactions of Aliphatic Amines with Thio-hydantoins: Atomic force microscopy and new mechanism. Angew. Chem. Int. Ed. Engl. 32, 1587-1589 (1993)
387. G. Kaupp: Solid-state reactions, dynamics in molecular crystals. Curr. Opin. in Solid State and Mater. Sci. 6, 131-138 (2002)
388. G. Kaupp: Solid-state molecular syntheses: Complete reactions without auxiliaries based on the new solid-state mechanism. CrystEngComm. 5, 117-133 (2003)
389. J.M. Leger, H. Aloualiti: X-ray study of anthracene under high pressure. Solid State Commun. 79, 901-904 (1991)
390. G. Kaupp, J. Schmeyers: Gas/solid reactions with nitrogen dioxide. J. Org. Chem. 60, 5494-5503 (1995)
391. R.A. Graham, P.M. Richards, R.D. Shrouf: Direct evidence for formation of radicals in a shock-loaded polymer. J. Chem. Phys. 72, 3421-3422 (1980)
392. N.K.Baramboim, I.I. Nikitina: Mechanical degradation of unsaturated three-dimensional polyesters. Izv. Akad. Nauk Kazak. SSR, Ser. Khim. 23, 77-79 (1973)
393. Chem. Abstr. 479583 (1973)
394. B.J. Briscoe, L. Flori, E. Pelillo: Nano-indentation of polymeric surfaces. J. Phys. D. 31, 2395-2405 (1998)
395. G. Kaupp, A. Herrmann, M.R. Naimi-Jamal, S. Stepanenko, V. Stepanenko: Near-field microscopy for organic and biological surfaces. Research report of the federal ministry for education and research (BMBF), FKZ 13N7519, 30.6.2003, 1-33 (2003); available upon request at TIB-UB Hannover, Germany: www.tib.uni-hannover.de
396. L. Jia, M. Mandanas, C. Miyasaka, B.R. Tittmann, G.L. Messing. Analysis of organic binder distribution in spray dried granules by ultrasonic-atomic force microscopy, Proc. SPIE 3585, 270-281 (1999)
397. U. Rabe, M. Kopycinska, S. Hirsekorn, W. Arnold. Evaluation of the contact resonance frequencies in atomic force microscopy as a method of surface characterization, Ultrasonics 40, 49-54 (2002)
398. W. Arnold, S. Amelio, S. Hirsekorn, U. Rabe. Quantitative contact spectroscopy and imaging by atomic-force acoustic microscopy, Mater. Res. Soc. Symp. Proc. 591, 183-194 (2000)
399. H. Berns: Microstructural properties of wear-resistant alloys. Wear 181-183, 271-279 (1995)
400. B.J. Briscoe, E. Pelillo, S.K. Sinha: Characterization of the surface deformation, yield and fracture of polymers during scratching. Deformation, Yield and Fracture of Polymers, International Conference, 10th, Cambridge, UK, Apr. 7-10, 1997, 474-477
401. Chem. Abstr. 774980 (1997)
402. J. Kleff: Warmritzen metallischer Werkstoffe. Fortschr.-Ber. VDI, Reihe 5 Nr. 340 VDI-Verlag GmbH, Düsseldorf 222p (1994), ISBN 3-18-334005-4
403. K.H. Zum Gahr: Microstructure and Wear of Materials. Tribology Series 10, 1987, Elsevier, Amsterdam
404. B. Bhushan (ed.): Microscratch and Microwear Studies, Springer Handbook of Nanotechnology, Chapter 26.3.2, pp. 813-822, (1994) Springer, Berlin (1994)
405. A. Rodrigo, H. Ichimura: Analytical correlation of hardness and scratch adhesion for hard films. Argent. Sur. Coat. Technol. 148, 8-17 (2001)
406. G. Kaupp, J. Schmeyers, U. Pogodda, M. Haak, T. Marquardt, M. Plagmann: AFM for the imaging of large and steep submicroscopic features, artifacts and scraping with asymmetric cantilever tips. Thin Solid Films 264, 205-211 (1995)
407. G. Kaupp, M. Plagmann: Atomic force microscopy and solid state photolyses: phase rebuilding. J. Photochem. Photobiol. A 80, 399-407 (1994)
408. P. Grau, G. Berg, W. Fränzel, H. Meinhard: Recording hardness testing. Problems of measurement at small indentation depths. Phys. Stat. Sol. A 146, 537-548 (1994)
409. E. Amitay-Sadovsky, S. Zheng, J. Smith, H. D. Wagner: Directional indentation of transcrystalline polypropylene. Acta Polym. 49, 588-593 (1998)
410. G. Kaupp, J. Schmeyers, U.D. Hangen: Anisotropic molecular movements in organic crystals by mechanical stress. J. Phys. Org. Chem. 15, 307-313 (2002)
411. U.D. Hangen: A Comparison of Nano-Hardness and Scratch-Resistance on Mohs Minerals. Z. Metallkd. 92, 1074-1077 (2001)
412. G. Kaupp, M.R. Naimi-Jamal: Nanoscratching on surfaces: the relationships between lateral force, normal force and normal displacement. Z. Metallkd. 95, 297-305 (2004)
413. S. Mosch, P. Grau, G. Berg: Nanotribological measurements on sol-gel derived silica films. Mater. Res. Soc. Symp. Proc. 522, 415-420 (1998)
414. S. Enders, P. Grau, G. Berg: Mechanical characterization of surfaces by nan-otribological measurements of sliding and abrasive terms. Mater. Res. Soc. Symp. Proc. 594, 531-536 (2000)
415. A. C. Fischer-Cripps: Nanoindentation, Mechanical Engineering Series, Springer, New York (2002)
416. M.R. Naimi-Jamal, G. Kaupp: Quantitative evaluation of nanoindents: Do we need more reliable mechanical parameters for the characterization of materials? Z. Metallkd, 96, 1226-1236 (2005)
417. V. D. Jardret, W. C. Oliver: Viscoelastic behavior of polymer films during scratch test: A quantitative analysis. Mater. Res. Soc. Symp. Proc. 594, 251-256 (2000)
418. J.L. Bucaille, E. Felder: Mechanics of the scratch test on polymers and metals: Modeling and experimental approaches. Mater. Tech. 3-4, 29-44 (2001)
419. M.J. Adams, A. Allan, B.J. Briscoe, P.J. Doyle, D.M. Gorman, S.A. Johnson: An experimental study of the nano-scratch behaviour of poly(methyl methacry-late). Wear 251, 1579-1583 (2001)
420. S.V. Prasad, T.H. Kosel: A comparison of carbide fracture during fixed depth and fixed load scratch tests. Proceedings Conference Wear of Materials, April 14-18 1985, Vancouver, (Ed) K.C. Ludema, ASME, New York (1985)
421. G. Kaupp, M.R. Naimi-Jamal: Unpublished results
422. G. Kaupp, M.R. Naimi-Jamal, J. Schmeyers: Quantitative reaction cascades of ninhydrin in the solid state. Chem. Eur. J. 8, 594-600 (2002)
423. N. A. Stilwell, D. Tabor: Elastic recovery of conical indentations. Proc. Phys. Soc. London, 78, 169-179 (1961)
424. K. Trachenko, M. Dove, T. Martin: Intermediate state in pressurized silica glass: Reversibility window analogue. Phys. Rev. B 67, 212203/1-212203/3 (2003)
425. 3). Phase Transit. 3, 339-345 (1983)
426. 3. J. Phys. Soc. Jpn. 46, 581-586 (1979)
427. A.L. Ruoff: High Pressure Phase Transformations. In Materials Science and Technology a Comprehensive Treatment. Vo l. 5, Chapter 8 (eds. R.W. Cahn, P. Haasen, E.J. Kramer), VCH, Weinheim (1991)
428. R.J. Needs, A. Mujica: First-principles pseudopotential study of the structural phases of silicon. Phys. Rev. B 51, 9652-9660 (1995)
429. A. Kailer, K.G. Nickel, Y.G. Gogotsi: Raman microspectroscopy of nanocrys-talline and amorphous phases in hardness indentations. J. Raman Spectr. 30, 939-946 (1999)
430. Y. Gogotsi, T. Miletich, M. Gardner, M. Rosenberg: Microindentation device for in situ study of pressure-induced phase transformations. Rev. Sci. Instrum. 70, 4612-4617 (1999)
431. C. Riekel, M.C.G. Gutierrez, A. Gourrier, S. Roth: Recent synchrotron radiation microdiffraction experiments on polymer and biopolymer fibers. Anal. Bioanal. Chem. 376, 594-601 (2003)
432. A. Gourrier, M.C.G. Gutierrez, C. Riekel: Combined microindentation and synchrotron radiation microdiffraction applied to polymers. Macromolecules 35, 8072-8077 (2002)
433. G. Kaupp, M.R. Naimi-Jamal, A. Gourrier, C. Riekel: Possibilities of studying phase transformation upon microindentation and nanoscratching by synchrotron radiation microdiffraction. Lecture at the 6th European Symposium on Nanomechanical Testing, Aug. 30-Sept. 1 (2005)
434. R. Ahuja, S. Rekhi, B. Johansson: Theoretical prediction of a phase transition in gold. Phys. Rev. B 63, 212101/1-212101/3 (2001)
435. M.I. Novgorodova, A.I. Gorskov, A.V. Mokhov: Native silver and its new structural modifications. Zap. Vses. Mineralogich. Obshch. 108, 552-563 (1979)
436. J.A. Xu, J.Z. Hu: X-ray diffraction under high pressure. Wuli Xxuebao 26, 521-525 (1977)
437. B. Baranowski, M. Tkacz, R. Majchrzak (eds. R. Pucci, G. Piccito). In Molecular systems under high pressure, p. 139, Elsevier Science Publishers B.V., North-Holland (1991)
438. B. Matthew Scott: Phase transformation through shearing under pressure with and without oil lubrication (copper, silver, alloying, amorphous alloys, tribol-ogy). Diss. Univ. of Virginia, Charlottesville, USA, 141 pp, Avail. UMI, Order No. DA9724740 (1997)
439. Diss. Abstr. Int., B 58, 1470 (1997)
440. H.Iwasaki, T. Fujimura, M. Ichikawa, S. Endo, M. Wakatsuki: Pressure-induced phase transformation in silver-zinc alloy. J. Phys. and Chem. of Solids 46, 463-468 (1985)
441. C.R. Tellier, G. Benmessaouda: Scratching experiments on quartz crystals: Orientation effects in chipping. J. Mater. Sci. 29, 3281-3294 (1994)
442. G. Kaupp, M.R. Naimi-Jamal: Mechanically induced molecular migrations in molecular crystals. Cryst. Eng. Commun. 7, 402-410 (2005)
443. G. Kaupp: Supermicroscopy: AFM, SNOM, and SXM. In Comprehensive Supramolecular Chemistry, vol. 8, 381-423 (eds. J.E.D. Davies, J.A.Ripmeester), Elsevier: Oxford (1996)
444. G. Kaupp: Solid-state molecular syntheses: complete reactions without auxiliaries based on the new solid-state mechanism. CrystEngComm 5, 117-133 (2003)
445. A.Herrmann, G. Kaupp, T. Geue, U. Pietsch: atomic force microscopy and grazing incidence diffraction investigation of the gas-solid diazotization of sul-fanilic acid. Mol. Cryst. Liq. Cryst. 293, 261-275 (1997)
446. C. Gauthier, R. Schirrer: Viscoelastic-viscoplastic analyses of a scratching and sliding single contact on a polymer surface. Adv. Mech. Behav., Plast. Damage, Proc. Euromat 1, 213-218 (2000)
447. B.D. Beake, G.J. Leggett: Nanoindentation and nanoscratch testing of uni-axially and biaxially drawn poly(ethylene terephthalate) film. Polymer 43, 319-327 (2002)
448. P. Morel, V. Jardret: Viscoelastic effects on the scratch resistance of polymers: Relationship between mechanical properties and scratch properties at various temperatures. Mater. Res. Soc. Proc. 710, 93-98 (2002)
449. J. Becht, H. Fischer: Strain-induced structural changes in highly oriented, partially crystalline polymers observed by ESR studies. Angew. Makromol. Chem. 18, 81-91 (1971)
450. R.A. Graham, P. M. Richards, R.D. Shrouf: Direct evidence for formation of radicals in a shock-loaded polymer. J. Chem. Phys. 72, 3421-3422 (1980)
451. S.E. Bresler, S.N. Zhurkov, E.N. Kazbekov, E.M. Saminskii, E.E. Toma-shevskii; Investigation of macroradicals arising during mechanical destruction of polymers, Z. Sakh. Promysh. 29, 358-364 (1959)
452. Chem. Abstr. 108586 (1959)
453. T.N. Kleinert: Stable free radicals in various lignin preparations. Tappi 50, 120-122 (1967)
454. M.O.W. Richardson, M.W. Pascoe: Mechano-chemistry and poly(vinyl chloride) wear. Polymer Science and Technology, Adv. Polym. Frict. Wear 5B, 585-597 (1974)
455. G.A. Gorokhovskii, P.A. Chernenko, V.A. Vonsyatskii, I.A. Popov: Mechanical-chemical processes in the contact zone of a metal in a polymer-abrasive environment. Primen. Polim. Kach. Antifricts. Mater. Respub. Nauch.-Tekh. Konf. 189-195 (1971)
456. Chem. Abstr. 48641 (1974)
457. D. Saidov: Physics of elastomer failure. Dokl. Akad. Nauk. Tadzh. SSR 31, 654-657 (1988)
458. N.K.Baramboim, I.I. Nikitina: Mechanical degradation of unsaturated three-dimensional polyesters. Izv. Akad. Nauk Kazakh. SSR, Ser. Khim. 23, 77-79 (1973)
459. Chem. Abstr. 479583 (1973)
460. L. Wenning, M. H. Müser: Friction laws for elastic nanoscale contacts. Euro-phys. Lett. 54, 693-699 (2001)