Optimizing the near field around silver tips

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 20, Issue 12, 2003, Pages 2254-2259

  Sun, Wan Xin ^a   Shen, Ze Xiang ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FINITE DIFFERENCE METHOD; INFRARED SPECTROSCOPY; LIGHT POLARIZATION; LITHOGRAPHY; MATHEMATICAL MODELS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTIMIZATION; REFLECTION; TIME DOMAIN ANALYSIS;

NEAR FIELD LITHOGRAPHY; NEAR FIELD SCANNING OPTICAL SPECTROSCOPY;

OPTICAL SYSTEMS;

EID: 0345763756     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.20.002254     Document Type: Article

References (27)

1. H. Furukawa and S. Kawata, "Analysis of image formation in a near-field scanning optical microscope: effects of multipole scattering," Opt. Commun. 132, 170-178 (1996).
2. D. A. Christensen, "Analysis of near field tip patterns including object interaction using finite-difference time-domain calculations," Ultramicroscopy 57, 189-195 (1995).
3. M. Tanaka and K. Tanaka, "Computer simulation for two-dimensional near-field optics with use of a metal-coated dielectric probe," J. Opt. Soc. Am. A 18, 919-925 (2001).
4. N. Garcia and M. Nieto-Vesperinas, "Theory for the apertureless near-field optical microscope: image resolution," Appl. Phys. Lett. 66, 3399-3400 (1995).
5. H. Sasaki and Y. Sasaki, "Imaging of refractive index change by the reflection-mode scattering-type scanning near-field optical microscope: simulation and observations," J. Appl. Phys. 85, 2026-2030 (1999).
6. M. Yamaguchi, Y. Sasaki, H. Sasaki, T. Konada, Y. Horikawa, A. Ebina, T. Umezawa, and T. Horiguchi, "Imaging of optical disc using reflection-mode scattering-type scanning near-field optical microscopy," J. Microsc. 194, 552-557 (1999).
7. R. Hillenbrand, B. Knoll, and F. Keilmann, "Pure optical contrast in scattering-type scanning near-field microscopy," J. Microsc. 2002, 77-83 (2001).
8. B. Knoll and F. Keilmann, "Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy," Opt. Commun. 182, 321-328 (2000).
9. A. Madrazo, M. Nieto-Vesperinas, and N. Garcia, "Exact calculation of Maxwell equations for a tip-metallic interface configuration: application to atomic resolution by photon emission," Phys. Rev. B 53, 3654-3657 (1996).
10. M. Quinten, "Evanescent wave scattering by aggregates of clusters-application to optical near-field microscopy," Appl. Phys. B 70, 579-586 (2000).
11. F. Zenhausern, M. P. O'Boyle, and H. K. Wickramasinghe, "Apertureless near-field optical microscope," Appl. Phys. Lett. 65, 1623-1625 (1994).
12. F. Zenhausern, Y. Martin, and H. K. Wickramasinghe, "Scanning interferometric apertureless microscopy: optical imaging at 10 angstrom resolution," Science 269, 1083-1085 (1995).
13. L. Novotny, D. W. Pohl, and B. Hecht, "Light confinement in scanning near-field optical microscopy," Ultramicroscopy 61, 1-9 (1995).
14. N. Garcia and M. Nieto-Vesperinas, "Direct solution to the inverse scattering problem for surfaces from near-field intensities without phase retrieval," Opt. Lett. 20, 949-951 (1996).
15. N. Hayazawa, Y. Inouye, Z. Sekkat, and S. Kawata, "Metallized tip amplification of near-field Raman scattering," Opt. Commun. 183, 333-336 (2000).
16. H. Furukawa and S. Kawata, "Local field enhancement with an apertureless near-field-microscope probe," Opt. Commun. 148, 221-224 (1998).
17. J. L. Bohn, D. J. Nesbitt, and A. Gallagher, "Field enhancement in apertureless scanning optical microscopy," J. Opt. Soc. Am. A 18, 2998-3006 (2001).
18. W. X. Sun and Z. X. Shen, "Apertureless near-field scanning Raman microscopy using reflection scattering geometry," Ultramicroscopy 94, 237-244 (2003).
19. W. Denk and D. W. Pohl, "Near-field optics: microscopy with nanometer-size fields," J. Vac. Sci. Technol. B 9, 510-513 (1991).
20. Y. C. Martin, H. F. Hamann, and H. K. Wickramasinghe, "Strength of the electric field in apertureless near-field optical microscopy," J. Appl. Phys. 89, 5774-5778 (2001).
21. J. T. Krug II, E. J. Sánchez, and X. S. Xie, "Design of near-field optical probes with optimal field enhancement by finite difference time domain electromagnetic simulation," J. Chem. Phys. 116, 10895-10901 (2002).
22. O. J. F. Martin and C. Girard, "Controlling and tuning strong optical field gradients at a local probe microscope tip apex," Appl. Phys. Lett. 70, 705-707 (1997).
23. O. J. F. Martin, C. Girard, and A. Dereux, "Generalized field propagator for electromagnetic scattering and light confinement," Phys. Rev. Lett. 74, 526-529 (1995).
24. J. B. Judkins and R. W. Ziolowski, "Finite-difference time-domain modeling of non-perfectly conducting metallic thin-film gratings," J. Opt. Soc. Am. A 12, 1974-1983 (1995).
25. E. N. Economou, Green's Functions in Quantum Physics, 2nd ed. (Springer, Berlin, 1990).
26. P. C. Chaumet, A. Rahmani, F. de Fornel, and J. P. Dufour, "Evanescent light scattering: the validity of the dipole approximation," Phys. Rev. B 58, 2310-2315 (1998).
27. L. Novotny, R. X. Bian, and X. S. Xie, "Theory of nanometric optical tweezers," Phys. Rev. Lett. 79, 645-648 (1997).