Near-field optical microscopy with uncoated tips: Calibration, chemical contrast on organic crystals, and photolithography

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 4, 1997, Pages 1521-1526

  Kaupp, G ^a   Herrmann, A ^a   Haak, M ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345230149     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589487     Document Type: Article

References (28)

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16. 2: this work.
17. 2: this work.
18. The slopes to the north and to the south are artificially traced steeper due to dithering in north/south direction when the scan proceeds from west to east, as usual.
19. Sample from the Max Planck Institut FKF, Stuttgart, courtesy of M. Schüttler; G. Kaupp, A. Herrmann, W. Rühle, M. Schüttler, and R. Rettig (unpublished).
20. (a) G. Kaupp and M. Plagmann, J. Photochem. Photobiol. A 80, 399 (1994)
21. (b) we are working on the development of local near-field spectroscopy (Raman and fluorescence) with a charge coupled device (CCD) detection unit for the internal reflection SNOM to obtain more precise identification of the chemical species now identified by relative near-field reflectance; presently available systems are not suitable for very rough organic crystals.
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