The use of atomic force microscopy (AFM) to study the surface topography of commercial fluid cracking catalysts (FCCs) and pillared interlayered clay (PILC) catalysts

Studies in Surface Science and Catalysis

Volumn 149, Issue , 2004, Pages 71-104

  Occelli, Mario L ^a   Gould, Scot A C ^b  

^a MLO Consulting   (United States)

^b KECK GRADUATE INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 8644290200     PISSN: 01672991     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0167-2991(04)80757-2     Document Type: Article

References (46)

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