Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really?

Journal of Applied Physics

Volumn 81, Issue 6, 1997, Pages 2499-2503

  Sandoghdar, V ^b   Wegscheider, S ^b   Krausch, G ^a,b   Mlynek, J ^b  

^a UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001361139     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363957     Document Type: Article

References (20)

1. D. W. Pohl and W. Denk, M. Lanz, Appl. Phys. Lett. 44, 651 (1984).
2. A. Lewis, M. Isaacson, A. Harootunian, and A. Muray, Ultramicroscopy 13, 227 (1984).
3. M. Peasler, P. J. Moyer, Near-Field Optics Theory, Instrumentation, and Applications, (Wiley, New York, 1996).
4. D. Courjon and C. Bainier, Rep. Prog. Phys. 57, 989 (1994).
5. F. Zenhausern, M. P. O'Boyle, and H. K. Wickramasinghe. Appl. Phys. Lett. 65, 1623 (1994).
6. D. Courjon, J.-M. Vigoureux, M. Spajer, K. Sarayeddine, and S. Leblanc, Appl. Opt. 29, 3734 (1990).
7. B. Labani, C. Girard, D. Courjon, and D. Van Labeke, J. Opt. Soc. Am. B 7, 936 (1990).
8. C. Girard and M. Spajer, Appl. Opt. 29, 3726 (1990).
9. D. Van Labeke and D. Barchiesi, in Near Field Optics, edited by D. W. Pohl and D. Courjon (Kluwer, Dordrecht, 1993), p. 157.
10. S. I. Bozhevolnyi, M. Xiao, and O. Keller, Appl. Opt. 33, 876 (1994).
11. H. Bielefeldt, I. Hörsch, G. Krausch, M. Lux-Steiner, J. Mlynek, and O. Marti, Appl. Phys. A 59, 103 (1994).
12. G. Krausch, S. Wegscheider, A. Kirsch, H. Bielefeldt, J. C. Meiners, and J. Mlynek, Opt. Commun. 119, 283 (1995).
13. TM SNOM, a device based on a reflection SNOM with uncoated fiber tips, is commercially available from Danish Micro Engineering A/S. Transformervej 12, DK-2730 Herlev, Denmark.
14. The pattern was designed by J. Cline and fabricated at the National Nanofabrication Facility at Cornell University in collaboration with J. Cline, G. Valaskovicz, and R. Tiberio.
15. E. Betzig, in Near Field Optics, edited by D. W. Pohl and D. Courjon (Kluwer, Dordrecht, 1993), p. 7.
16. S. I. Bozhevolnyi, I. I. Smolyaninov, and O. Keller, Appl. Opt. 34, 3793 (1995).
17. B. Hecht, H. Bielefeldt, Y. Inouye, D. W. Pohl. and L. Novotny, J. Appl. Phys. 81, 2492 (1997).
18. E. L. Buckland, P. J. Moyer, and M. A. Paesler, J. Appl. Phys. 73, 1018 (1993).
19. M. Xiao and S. Bozhevolnyi, Opt. Commun. 130, 337 (1996).
20. S. Wegscheider, G. Krausch, V. Sandoghdar, and J. Mlynek (unpublished).