Atomic force microscopy - a powerful tool for industrial applications

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 401-409

  Karbach, A ^a   Drechsler, D ^a  

^a BAYER AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; METALS; MORPHOLOGY; ORGANIC COMPOUNDS; POLYURETHANES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

DOMAIN STRUCTURE; HARD SEGMENT; SOFT SEGMENT;

ATOMIC FORCE MICROSCOPY;

EID: 0032654311     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199905/06)27:5/6<401::AID-SIA533>3.0.CO;2-A     Document Type: Article

References (5)

1. Manual Dimension 3000. Digital Instruments.
2. I.D. Friedman and E. L. Thomas, Polymer 21, 388 (1980).
3. D. Reifer, R. Windeit, R. J. Kumpf, A. Karbach and H. Fuchs, Thin Solid Films 264, 148 (1995).
4. L. C. Sawyer and D. T. Grubb, Polymer Microscopy. Chapman and Hall, New York (1987).
5. D. Drechsler, Doctor Thesis, Universität Münster, Münster, Germany (1998).