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Volumn 247, Issue 3, 2001, Pages 601-608
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Advanced surface techniques for characterization of Cu-base artefacts
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Author keywords
[No Author keywords available]
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Indexed keywords
ALLOY;
COPPER;
ANALYTIC METHOD;
ARTIFACT;
ATOMIC FORCE MICROSCOPY;
CONFERENCE PAPER;
CORROSION;
SURFACE PROPERTY;
X RAY DIFFRACTION;
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EID: 0035103560
PISSN: 02365731
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1010663417536 Document Type: Conference Paper |
Times cited : (5)
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References (18)
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