Topological structure and chemical composition of inner surfaces of borosilicate vials

PDA Journal of Pharmaceutical Science and Technology

Volumn 58, Issue 3, 2004, Pages 169-175

  Schwarzenbach, Monica S ^a,b,c   Reimann, Peter ^a   Thommen, Verena ^a   Hegner, Martin ^a   Mumenthaler, Marco ^b   Schwob, Jacky ^b   Güntherodt, Hans Joachim ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b F HOFFMANN LA ROCHE LTD   (Switzerland)

^c Mepha Ltd   (Switzerland)

Author keywords

Atomic force microscopy (AFM); Borosilicate glass; Topography; Vials; X ray photoelectron spectroscopy (XPS)

Indexed keywords

BOROSILICATE; GLASS; SILICATE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; CHEMICAL MODIFICATION; INSTRUMENT STERILIZATION; PH; X RAY PHOTOELECTRON SPECTROSCOPY;

BORON COMPOUNDS; DRUG PACKAGING; PHARMACEUTICAL SOLUTIONS; SILICATES; SPECTROMETRY, X-RAY EMISSION; SURFACE PROPERTIES;

EID: 2942595760     PISSN: 10797440     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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