Chemical imaging with scanning near-field infrared microscopy and spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4098, Issue , 2000, Pages 102-109

  Michaels, Chris A ^a   Richter, Lee J ^a   Cavanagh, Richard R ^a   Stranick, Stephan J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ETCHING; IMAGE ANALYSIS; IMAGE QUALITY; INFRARED SPECTROMETERS; INFRARED SPECTROSCOPY; MOLECULAR DYNAMICS; MOLECULAR VIBRATIONS; SENSITIVITY ANALYSIS; SINGLE MODE FIBERS; THIN FILMS;

CHEMICAL IMAGING; INFRARED MICROSCOPY; NEAR-FIELD SCANNING OPTICAL MICROSCOPY (SNOM); VIBRATIONAL SPECTROSCOPY;

OPTICAL MICROSCOPY;

EID: 0033656167     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.401616     Document Type: Conference Paper

References (25)