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Volumn 68, Issue 4, 1997, Pages 1769-1772

Distance control in near-field optical microscopy with piezoelectrical shear-force detection suitable for imaging in liquids

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001162426     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147990     Document Type: Article
Times cited : (83)

References (15)
  • 15
    • 85033175453 scopus 로고    scopus 로고
    • PI Physik Instrumente, PZT Model P-730.20
    • PI Physik Instrumente, PZT Model P-730.20.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.