메뉴 건너뛰기




Volumn 14, Issue 9, 1997, Pages 2254-2259

Topographical artifacts and optical resolution in near-field optical microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0031533048     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.14.002254     Document Type: Article
Times cited : (45)

References (26)
  • 4
    • 84975562540 scopus 로고
    • General principles of scanning tunneling optical microscopy
    • J.-M. Vigoureux, C. Girard, and D. Courjon, "General principles of scanning tunneling optical microscopy," Opt. Lett. 14, 1039-1041 (1989).
    • (1989) Opt. Lett. , vol.14 , pp. 1039-1041
    • Vigoureux, J.-M.1    Girard, C.2    Courjon, D.3
  • 5
    • 21544436741 scopus 로고
    • Combined shear force and near-field scanning optical microscopy
    • E. Betzig, P. L. Finn, and J. S. Weiner, "Combined shear force and near-field scanning optical microscopy," Appl. Phys. Lett. 60, 2484-2486 (1992).
    • (1992) Appl. Phys. Lett. , vol.60 , pp. 2484-2486
    • Betzig, E.1    Finn, P.L.2    Weiner, J.S.3
  • 6
    • 21544443037 scopus 로고
    • Near-field differential scanning optical microscope with atomic force regulation
    • R. Toledo-Crow, P. C. Yang, Y. Chen, and M. Vaez-Iravani, "Near-field differential scanning optical microscope with atomic force regulation," Appl. Phys. Lett. 60, 2957-2959 (1992).
    • (1992) Appl. Phys. Lett. , vol.60 , pp. 2957-2959
    • Toledo-Crow, R.1    Yang, P.C.2    Chen, Y.3    Vaez-Iravani, M.4
  • 7
    • 0000273633 scopus 로고
    • A simple lateral force sensing technique for near-field micropattern generation
    • A. Shchemelin, M. Rudman, K. Lieberman, and A. Lewis, "A simple lateral force sensing technique for near-field micropattern generation," Rev. Sci. Instrum. 64, 3538-3541 (1993).
    • (1993) Rev. Sci. Instrum. , vol.64 , pp. 3538-3541
    • Shchemelin, A.1    Rudman, M.2    Lieberman, K.3    Lewis, A.4
  • 9
    • 0000599116 scopus 로고
    • Correlation between optical and topographical images from an external reflection near-field microscope with shear force feedback
    • S. I. Bozhevolnyi, I. I. Smolyaninov, and O. Keller, "Correlation between optical and topographical images from an external reflection near-field microscope with shear force feedback," Appl. Opt. 34, 3793-3799 (1995).
    • (1995) Appl. Opt. , vol.34 , pp. 3793-3799
    • Bozhevolnyi, S.I.1    Smolyaninov, I.I.2    Keller, O.3
  • 10
    • 0001038971 scopus 로고
    • Near field microscopy and near field optics
    • D. Courjon and C. Bainier, "Near field microscopy and near field optics," Rep. Prog. Phys. 57, 989-1028 (1994).
    • (1994) Rep. Prog. Phys. , vol.57 , pp. 989-1028
    • Courjon, D.1    Bainier, C.2
  • 11
    • 0000962310 scopus 로고    scopus 로고
    • Near-field optics theories
    • C. Girard and A. Dereux, "Near-field optics theories," Rep. Prog. Phys. 59, 657-699 (1996).
    • (1996) Rep. Prog. Phys. , vol.59 , pp. 657-699
    • Girard, C.1    Dereux, A.2
  • 12
    • 0000889357 scopus 로고
    • Generation of optical standing waves around mesoscopic surface structures: Scattering and light confinement
    • C. Girard, A. Dereux, O. J. F. Martin, and M. Devel, "Generation of optical standing waves around mesoscopic surface structures: scattering and light confinement," Phys. Rev. B 52, 2889-2898 (1995).
    • (1995) Phys. Rev. B , vol.52 , pp. 2889-2898
    • Girard, C.1    Dereux, A.2    Martin, O.J.F.3    Devel, M.4
  • 13
    • 0000592875 scopus 로고
    • Importance of confined fields in near-field optical imaging of subwavelength objects
    • C. Girard, A. Dereux, O. J. F. Martin, and M. Devel, "Importance of confined fields in near-field optical imaging of subwavelength objects," Phys. Rev. B 50, 14467-14473 (1994).
    • (1994) Phys. Rev. B , vol.50 , pp. 14467-14473
    • Girard, C.1    Dereux, A.2    Martin, O.J.F.3    Devel, M.4
  • 14
    • 0028955434 scopus 로고
    • Near-field imaging: Some attempts to define an apparatus function
    • D. Courjon, "Near-field imaging: some attempts to define an apparatus function," J. Microsc. 177, 180-185 (1995).
    • (1995) J. Microsc. , vol.177 , pp. 180-185
    • Courjon, D.1
  • 17
    • 70349683370 scopus 로고
    • Influence of dielectric contrast and topography on the near field scattered by an inhomogeneous surface
    • R. Carminati and J.-J. Greffet, "Influence of dielectric contrast and topography on the near field scattered by an inhomogeneous surface," J. Opt. Soc. Am. A 12, 2716-2725 (1995).
    • (1995) J. Opt. Soc. Am. A , vol.12 , pp. 2716-2725
    • Carminati, R.1    Greffet, J.-J.2
  • 18
    • 0030241056 scopus 로고    scopus 로고
    • Dielectric versus topographic contrast in near-field microscopy
    • O. J. F. Martin, C. Girard, and A. Dereux, "Dielectric versus topographic contrast in near-field microscopy," J. Opt. Soc. Am. A 13, 1801-1808 (1996).
    • (1996) J. Opt. Soc. Am. A , vol.13 , pp. 1801-1808
    • Martin, O.J.F.1    Girard, C.2    Dereux, A.3
  • 19
    • 0030130158 scopus 로고    scopus 로고
    • Scattering spectroscopy of molecules at nanometer resolution
    • Y. Martin, F. Zenhausern, and H. K. Wickramasinghe, "Scattering spectroscopy of molecules at nanometer resolution," Appl. Phys. Lett. 68, 2475-2477 (1996).
    • (1996) Appl. Phys. Lett. , vol.68 , pp. 2475-2477
    • Martin, Y.1    Zenhausern, F.2    Wickramasinghe, H.K.3
  • 20
    • 0030286266 scopus 로고    scopus 로고
    • Analysis of image formation in near-field scanning optical microscope: Effects of multiple scattering
    • H. Furukawa and S. Kawata, "Analysis of image formation in near-field scanning optical microscope: effects of multiple scattering," Opt. Commun. 132, 170-178 (1996).
    • (1996) Opt. Commun. , vol.132 , pp. 170-178
    • Furukawa, H.1    Kawata, S.2
  • 21
    • 0000853320 scopus 로고
    • New form of scanning optical microscopy
    • R. C. Reddick, R. J. Warmack, and T. L. Ferrel, "New form of scanning optical microscopy," Phys. Rev. B 39, 767-770 (1989); D. Courjon, K. Sarayeddine, and M. Spajer, "Scanning tunneling optical microscopy," Opt. Commun. 71, 23-28 (1989); F. de Fornel, J. P. Goudonnet, L. Salomon, and E. Lesniewska, "An evanescent field optical microscope," in Optical Storage and Scanning Technology, T. Wilson, ed., Proc. SPIE 1139, 77-84 (1989).
    • (1989) Phys. Rev. B , vol.39 , pp. 767-770
    • Reddick, R.C.1    Warmack, R.J.2    Ferrel, T.L.3
  • 22
    • 0024656196 scopus 로고
    • Scanning tunneling optical microscopy
    • R. C. Reddick, R. J. Warmack, and T. L. Ferrel, "New form of scanning optical microscopy," Phys. Rev. B 39, 767-770 (1989); D. Courjon, K. Sarayeddine, and M. Spajer, "Scanning tunneling optical microscopy," Opt. Commun. 71, 23-28 (1989); F. de Fornel, J. P. Goudonnet, L. Salomon, and E. Lesniewska, "An evanescent field optical microscope," in Optical Storage and Scanning Technology, T. Wilson, ed., Proc. SPIE 1139, 77-84 (1989).
    • (1989) Opt. Commun. , vol.71 , pp. 23-28
    • Courjon, D.1    Sarayeddine, K.2    Spajer, M.3
  • 23
    • 0347279376 scopus 로고
    • An evanescent field optical microscope
    • Optical Storage and Scanning Technology, T. Wilson, ed.
    • R. C. Reddick, R. J. Warmack, and T. L. Ferrel, "New form of scanning optical microscopy," Phys. Rev. B 39, 767-770 (1989); D. Courjon, K. Sarayeddine, and M. Spajer, "Scanning tunneling optical microscopy," Opt. Commun. 71, 23-28 (1989); F. de Fornel, J. P. Goudonnet, L. Salomon, and E. Lesniewska, "An evanescent field optical microscope," in Optical Storage and Scanning Technology, T. Wilson, ed., Proc. SPIE 1139, 77-84 (1989).
    • (1989) Proc. SPIE , vol.1139 , pp. 77-84
    • De Fornel, F.1    Goudonnet, J.P.2    Salomon, L.3    Lesniewska, E.4
  • 24
    • 0027685618 scopus 로고
    • Probes for scanning tunneling optical microscopy
    • D. Van Labeke and D. Barchiesi, "Probes for scanning tunneling optical microscopy," J. Opt. Soc. Am. A 10, 2193-2201 (1993).
    • (1993) J. Opt. Soc. Am. A , vol.10 , pp. 2193-2201
    • Van Labeke, D.1    Barchiesi, D.2
  • 25
    • 0030412353 scopus 로고    scopus 로고
    • Self-consistent model for photon scanning tunneling microscopy: Implications for image formation and light scattering near a phase-conjugating mirror
    • S. I. Bozhevolnyi, B. Vohnsen, E. A. Bozhevolnaya, and S. Berntsen, "Self-consistent model for photon scanning tunneling microscopy: implications for image formation and light scattering near a phase-conjugating mirror," J. Opt. Soc. Am. A 13, 2381-2392 (1996).
    • (1996) J. Opt. Soc. Am. A , vol.13 , pp. 2381-2392
    • Bozhevolnyi, S.I.1    Vohnsen, B.2    Bozhevolnaya, E.A.3    Berntsen, S.4
  • 26
    • 4143135577 scopus 로고    scopus 로고
    • Facts and artifacts in near-field optical microscopy
    • B. Hecht, H. Bielefeldt, Y. Inouye, and D. W. Pohl, "Facts and artifacts in near-field optical microscopy," J. Appl. Phys. 81, 2492-2498 (1997).
    • (1997) J. Appl. Phys. , vol.81 , pp. 2492-2498
    • Hecht, B.1    Bielefeldt, H.2    Inouye, Y.3    Pohl, D.W.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.