Interfacial force microscopy: Selected applications

NanoScience and Technology

Volumn 0, Issue , 2019, Pages 41-73

  Houston, Jack E ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85073695306     PISSN: 14344904     EISSN: 21977127     Source Type: Book Series    
DOI: 10.1007/978-3-642-35792-3_2     Document Type: Chapter

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