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Volumn 204, Issue 1, 2001, Pages 53-60
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Scanning force images through the 'Milliscope' - A probe microscope with very wide scan range
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Author keywords
Large scan; Millimetre scale; Scanning force microscope; Scanning probe microscope
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
HOME-BUILT;
LARGE SCAN;
MATCHINGS;
MILLIMETER-SCALE;
OPTICAL MICROSCOPES;
PROBE MICROSCOPE;
SCAN RANGE;
SCANNING FORCE MICROSCOPES;
SCANNING PROBE MICROSCOPE;
SCANNING PROBES;
MICROSCOPES;
ARTICLE;
CYTOLOGY;
DYNAMICS;
ELECTRON MICROSCOPE;
HISTOLOGY;
IMAGING;
OPTICAL RESOLUTION;
PRIORITY JOURNAL;
SCANNING FORCE MICROSCOPY;
SCANNING PROBE MICROSCOPY;
TECHNIQUE;
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EID: 0034778285
PISSN: 00222720
EISSN: None
Source Type: Journal
DOI: 10.1046/j.1365-2818.2001.00932.x Document Type: Article |
Times cited : (5)
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References (17)
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