메뉴 건너뛰기




Volumn 204, Issue 1, 2001, Pages 53-60

Scanning force images through the 'Milliscope' - A probe microscope with very wide scan range

Author keywords

Large scan; Millimetre scale; Scanning force microscope; Scanning probe microscope

Indexed keywords

ATOMIC FORCE MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

EID: 0034778285     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00932.x     Document Type: Article
Times cited : (5)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.