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Volumn 14, Issue 4, 1996, Pages 2432-2437

Structure imaging by atomic force microscopy and transmission electron microscopy of different light emitting species of porous silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0041337064     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588874     Document Type: Article
Times cited : (21)

References (21)
  • 5
    • 0003635359 scopus 로고    scopus 로고
    • Oxford University, Oxford, 1991, and references cited therein
    • D. Sarid, Scanning Force Microscopy (Oxford University, Oxford, 1991), and references cited therein.
    • Scanning Force Microscopy
    • Sarid, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.