-
4
-
-
84975624242
-
External and internal reflection near field microscopy: Experiments and results
-
D. Courjon, J.-M. Vigoureux, M. Spajer, K. Sarayeddine, and S. Leblanc, "External and internal reflection near field microscopy: experiments and results," Appl. Opt. 29, 3734-3740 (1990).
-
(1990)
Appl. Opt.
, vol.29
, pp. 3734-3740
-
-
Courjon, D.1
Vigoureux, J.-M.2
Spajer, M.3
Sarayeddine, K.4
Leblanc, S.5
-
5
-
-
36449003368
-
Photon scanning tunneling microscope in combination with a force microscope
-
M. H. P. Moers, R. G. Tack, N. F. van Hulst, and B. Bölger, "Photon scanning tunneling microscope in combination with a force microscope," J. Appl. Phys. 75, 1254-1257 (1994).
-
(1994)
J. Appl. Phys.
, vol.75
, pp. 1254-1257
-
-
Moers, M.H.P.1
Tack, R.G.2
Van Hulst, N.F.3
Bölger, B.4
-
6
-
-
0028732218
-
Direct measurement of standing evanescent waves with a photon-scanning tunneling microscope
-
A. J. Meixner, M. A. Bopp, and G. Tarrach, "Direct measurement of standing evanescent waves with a photon-scanning tunneling microscope," Appl. Opt. 33, 7995-8000 (1994).
-
(1994)
Appl. Opt.
, vol.33
, pp. 7995-8000
-
-
Meixner, A.J.1
Bopp, M.A.2
Tarrach, G.3
-
7
-
-
0027182733
-
Near-field optical microscopy in transmission and reflection modes in combination with force microscopy
-
N. F. Van Hulst, M. H. P. Moers, and B. Bölger, "Near-field optical microscopy in transmission and reflection modes in combination with force microscopy," J. Microsc. 171, 95-105 (1993).
-
(1993)
J. Microsc.
, vol.171
, pp. 95-105
-
-
Van Hulst, N.F.1
Moers, M.H.P.2
Bölger, B.3
-
8
-
-
0005298252
-
The reflection near field optical microscope: An alternative to STOM
-
Kluwer, Dordrecht, The Netherlands
-
M. Spajer and A. Jalocha, "The reflection near field optical microscope: an alternative to STOM," in Near Field Optics (Kluwer, Dordrecht, The Netherlands, 1993), pp. 87-96.
-
(1993)
Near Field Optics
, pp. 87-96
-
-
Spajer, M.1
Jalocha, A.2
-
9
-
-
0028371338
-
External-reflection near-field optical microscope with cross-polarized detection
-
S. I. Bozhevolnyi, M. Xiao, and O. Keller, "External-reflection near-field optical microscope with cross-polarized detection," Appl. Opt. 33, 876-880 (1994).
-
(1994)
Appl. Opt.
, vol.33
, pp. 876-880
-
-
Bozhevolnyi, S.I.1
Xiao, M.2
Keller, O.3
-
10
-
-
0000599116
-
Correlation between optical and topographical images from an external reflection near-field microscope with shear force feedback
-
S. I. Bozhevolnyi, I. I. Smolyaninov, and O. Keller, "Correlation between optical and topographical images from an external reflection near-field microscope with shear force feedback," Appl. Opt. 34, 3793-3799 (1995).
-
(1995)
Appl. Opt.
, vol.34
, pp. 3793-3799
-
-
Bozhevolnyi, S.I.1
Smolyaninov, I.I.2
Keller, O.3
-
11
-
-
0028532416
-
Phase conjugation of an optical near field
-
S. I. Bozhevolnyi, O. Keller, and I. I. Smolyaninov, "Phase conjugation of an optical near field," Opt. Lett. 19, 1601-1603 (1994).
-
(1994)
Opt. Lett.
, vol.19
, pp. 1601-1603
-
-
Bozhevolnyi, S.I.1
Keller, O.2
Smolyaninov, I.I.3
-
12
-
-
0013353598
-
Dielectric and fluorescent samples imaged by scanning near-field optical microscopy in reflection
-
A. Jalocha and N. F. van Hulst, "Dielectric and fluorescent samples imaged by scanning near-field optical microscopy in reflection," Opt. Commun. 119, 17-22 (1995).
-
(1995)
Opt. Commun.
, vol.119
, pp. 17-22
-
-
Jalocha, A.1
Van Hulst, N.F.2
-
13
-
-
0001396270
-
Near-field microscopy of surface-plasmon polaritons: Localization and internal interface imaging
-
S. I. Bozhevolnyi, I. I. Smolyaninov, and A. V. Zayats, "Near-field microscopy of surface-plasmon polaritons: localization and internal interface imaging," Phys. Rev. B 51, 17916-17924 (1995).
-
(1995)
Phys. Rev. B
, vol.51
, pp. 17916-17924
-
-
Bozhevolnyi, S.I.1
Smolyaninov, I.I.2
Zayats, A.V.3
-
14
-
-
0029375628
-
Near field microscopy and lithography with uncoated fiber tips: A comparison
-
G. Krausch, S. Wegscheider, A. Kirsch, H. Bielefeldt, J. C. Meiners, and J. Mlynek, "Near field microscopy and lithography with uncoated fiber tips: a comparison," Opt. Commun. 119, 283-288 (1995).
-
(1995)
Opt. Commun.
, vol.119
, pp. 283-288
-
-
Krausch, G.1
Wegscheider, S.2
Kirsch, A.3
Bielefeldt, H.4
Meiners, J.C.5
Mlynek, J.6
-
15
-
-
0028382667
-
Extension of the macroscopic model for reflection near-field microscopy: Regularization and image formation
-
S. Bozhevolnyi, S. Berntsen, and E. Bozhevolnaya, "Extension of the macroscopic model for reflection near-field microscopy: regularization and image formation," J. Opt. Soc. Am. A 11, 609-617 (1994).
-
(1994)
J. Opt. Soc. Am. A
, vol.11
, pp. 609-617
-
-
Bozhevolnyi, S.1
Berntsen, S.2
Bozhevolnaya, E.3
-
16
-
-
0030412353
-
Self-consistent model for photon scanning tunneling microscopy: Implications for image formation and light scattering near a phase-conjugating mirror
-
S. I. Bozhevolnyi, B. Vohnsen, E. A. Bozhevolnaya, and S. Berntsen, "Self-consistent model for photon scanning tunneling microscopy: implications for image formation and light scattering near a phase-conjugating mirror," J. Opt. Soc. Am. A 13, 2381-2392 (1996).
-
(1996)
J. Opt. Soc. Am. A
, vol.13
, pp. 2381-2392
-
-
Bozhevolnyi, S.I.1
Vohnsen, B.2
Bozhevolnaya, E.A.3
Berntsen, S.4
-
17
-
-
0030141486
-
Numerical study of the tip-sample interaction in the photon scanning tunneling microscope
-
J. C. Weeber, F. de Fornel, and J. P. Goudonnet, "Numerical study of the tip-sample interaction in the photon scanning tunneling microscope," Opt. Commun. 126, 285-292 (1996).
-
(1996)
Opt. Commun.
, vol.126
, pp. 285-292
-
-
Weeber, J.C.1
De Fornel, F.2
Goudonnet, J.P.3
-
18
-
-
0029483682
-
Near-field direct-write ultraviolet lithography and shear force microscopic studies of the lithographic process
-
I. I. Smolyaninov, D. L. Mazzoni, and C. C. Davis, "Near-field direct-write ultraviolet lithography and shear force microscopic studies of the lithographic process," Appl. Phys. Lett. 67, 3859-3861 (1995).
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 3859-3861
-
-
Smolyaninov, I.I.1
Mazzoni, D.L.2
Davis, C.C.3
-
19
-
-
0001476616
-
Optical near-field lithography on hydrogen-passivated silicon surfaces
-
S. Madsen, M. Müllenborn, K. Birkelund, and F. Grey, "Optical near-field lithography on hydrogen-passivated silicon surfaces," Appl. Phys. Lett. 69, 544-546 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 544-546
-
-
Madsen, S.1
Müllenborn, M.2
Birkelund, K.3
Grey, F.4
-
20
-
-
0030285450
-
Near field optics: Snapshot of the field emitted by a nanosource using a photosensitive polymer
-
S. Davy and M. Spajer, "Near field optics: snapshot of the field emitted by a nanosource using a photosensitive polymer," Appl. Phys. Lett. 69, 3306-3308 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 3306-3308
-
-
Davy, S.1
Spajer, M.2
-
21
-
-
0000606347
-
Theoretical model for phase conjugation of optical near fields
-
S. I. Bozhevolnyi, E. A. Bozhevolnaya, and S. Berntsen, "Theoretical model for phase conjugation of optical near fields," J. Opt. Soc. Am. A 12, 2645-2654 (1995).
-
(1995)
J. Opt. Soc. Am. A
, vol.12
, pp. 2645-2654
-
-
Bozhevolnyi, S.I.1
Bozhevolnaya, E.A.2
Berntsen, S.3
-
22
-
-
0000799639
-
Macroscopic self-consistent model for external-reflection near-field microscopy
-
S. Berntsen, E. Bozhevolnaya, and S. Bozhevolnyi, "Macroscopic self-consistent model for external-reflection near-field microscopy," J. Opt. Soc. Am. A 10, 878-885 (1993).
-
(1993)
J. Opt. Soc. Am. A
, vol.10
, pp. 878-885
-
-
Berntsen, S.1
Bozhevolnaya, E.2
Bozhevolnyi, S.3
-
23
-
-
0029556585
-
Regularization in the macroscopic self-consistent model for near-field microscopy
-
E. A. Bozhevolnaya, S. I. Bozhevolnyi, and S. Berntsen, "Regularization in the macroscopic self-consistent model for near-field microscopy," Ultramicroscopy 61, 35-41 (1995).
-
(1995)
Ultramicroscopy
, vol.61
, pp. 35-41
-
-
Bozhevolnaya, E.A.1
Bozhevolnyi, S.I.2
Berntsen, S.3
-
24
-
-
0027653646
-
Control of the tip-surface distance in near-field optical microscopy
-
S. I. Bozhevolnyi, O. Keller, and M. Xiao, "Control of the tip-surface distance in near-field optical microscopy," Appl. Opt. 32, 4864-4868 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 4864-4868
-
-
Bozhevolnyi, S.I.1
Keller, O.2
Xiao, M.3
-
25
-
-
0001634767
-
Localization phenomena in elastic surface polariton scattering caused by surface roughness
-
S. I. Bozhevolnyi, "Localization phenomena in elastic surface polariton scattering caused by surface roughness," Phys. Rev. B 54, 8177-8185 (1996).
-
(1996)
Phys. Rev. B
, vol.54
, pp. 8177-8185
-
-
Bozhevolnyi, S.I.1
-
26
-
-
84975607645
-
Characterization of phase-conjugated near-field light spots
-
S. I. Bozhevolnyi and I. I. Smolyaninov, "Characterization of phase-conjugated near-field light spots," J. Opt. Soc. Am. B 12, 1617-1620 (1995).
-
(1995)
J. Opt. Soc. Am. B
, vol.12
, pp. 1617-1620
-
-
Bozhevolnyi, S.I.1
Smolyaninov, I.I.2
-
27
-
-
2742537079
-
The 90° prism edge as a model SNOM probe: Near-field, photon tunneling, and far-field properties
-
Kluwer, Dordrecht, The Netherlands
-
A. Dereux and D. W. Pohl, "The 90° prism edge as a model SNOM probe: near-field, photon tunneling, and far-field properties," in Near Field Optics (Kluwer, Dordrecht, The Netherlands, 1993), pp. 189-198.
-
(1993)
Near Field Optics
, pp. 189-198
-
-
Dereux, A.1
Pohl, D.W.2
-
28
-
-
0028459866
-
Light propagation through nanometer-sized structures: The two-dimensional-aperture scanning near-field microscope
-
L. Novotny, D. W. Pohl, and P. Regli, "Light propagation through nanometer-sized structures: the two-dimensional-aperture scanning near-field microscope," J. Opt. Soc. Am. A 11, 1768-1779 (1994).
-
(1994)
J. Opt. Soc. Am. A
, vol.11
, pp. 1768-1779
-
-
Novotny, L.1
Pohl, D.W.2
Regli, P.3
-
29
-
-
0000962310
-
Near-field optics theories
-
C. Girard and A. Dereux, "Near-field optics theories," Rep. Prog. Phys. 59, 657-699 (1996).
-
(1996)
Rep. Prog. Phys.
, vol.59
, pp. 657-699
-
-
Girard, C.1
Dereux, A.2
-
30
-
-
36449005000
-
Optically induced surface gratings on azoaromatic polymer films
-
P. Rochon, E. Batalla, and A. Natansohn, "Optically induced surface gratings on azoaromatic polymer films," Appl. Phys. Lett. 66, 136-138 (1995).
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 136-138
-
-
Rochon, P.1
Batalla, E.2
Natansohn, A.3
-
31
-
-
0029637530
-
Laser-induced holographic surface relief gratings on nonlinear optical polymer films
-
D. Y. Kim, S. K. Tripathy, L. Li, and J. Kumar, "Laser-induced holographic surface relief gratings on nonlinear optical polymer films," Appl. Phys. Lett. 66, 1166-1168 (1995).
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 1166-1168
-
-
Kim, D.Y.1
Tripathy, S.K.2
Li, L.3
Kumar, J.4
-
32
-
-
0029275861
-
Scattered light enhancement near a phase conjugating mirror
-
S. I. Bozhevolnyi, O. Keller, and I. I. Smolyaninov, "Scattered light enhancement near a phase conjugating mirror," Opt. Commun. 115, 115-120 (1995).
-
(1995)
Opt. Commun.
, vol.115
, pp. 115-120
-
-
Bozhevolnyi, S.I.1
Keller, O.2
Smolyaninov, I.I.3
|