SCOPUS 정보 검색 플랫폼

Volumn 66, Issue SUPPL. 1, 1998, Pages

A three-dimensional scanner for probemicroscopy on the millimeter scale

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; HIGH RESOLUTION; NANOMETRES; OPTICAL MICROSCOPES; SCAN RANGE; SCANNING PROBE MICROSCOPE;

ELECTROACOUSTIC TRANSDUCERS; MICROSCOPES; SCANNING;

THREE DIMENSIONAL;

EID: 25044467496 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051257 Document Type: Article

Times cited : (9)

References (11)

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