In situ AFM imaging system for the environmentally induced damage under dynamic loads in a controlled environment

ISIJ International

Volumn 43, Issue 4, 2003, Pages 579-588

  Minoshima, Kohji ^a   Oie, Yoshitaka ^a   Komai, Kenjiro ^b  

^a KYOTO UNIVERSITY   (Japan)

^b NONE

Author keywords

Atomic force microscopy; Crack tip opening displacement; Cyclic SCC; Dynamic loading; Dynamic SCC; Fatigue; High strength stainless steel; Hydrogen embrittlement; In situ observation; Nanoscopic imaging; Stress corrosion cracking

Indexed keywords

ACTUATORS; ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; DYNAMIC LOADS; MECHANICAL TESTING; NANOSTRUCTURED MATERIALS; STAINLESS STEEL; SURFACE TOPOGRAPHY; WEATHERING;

CRACK TIP OPENING DISPLACEMENT; ELECTROMAGNETIC ACTUATORS; ENVIRONMENTALLY INDUCED DAMAGE; NANOSCOPIC IMAGING;

STRESS CORROSION CRACKING;

EID: 0037932038     PISSN: 09151559     EISSN: None     Source Type: Journal    
DOI: 10.2355/isijinternational.43.579     Document Type: Article

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