Artifacts in Scanning Near-field Optical Microscopy (SNOM) due to deficient tips

Journal of Physical Organic Chemistry

Volumn 12, Issue 11, 1999, Pages 797-807

  Kaupp, Gerd ^a   Herrmann, Andreas ^a   Haak, Michael ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

Artifacts; Chemical contrast; Enhanced reflectance; Interactive VRML files; Near field; SNOM; Uncoated tips

Indexed keywords

EID: 0000270246     PISSN: 08943230     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1395(199911)12:11<797::AID-POC204>3.0.CO;2-S     Document Type: Review

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