Are artefacts in scanning near-field optical microscopy related to the misuse of shear force?

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 165-175

  Williamson, R L ^a   Brereton, L J ^a   Antognozzi, M ^a   Miles, M J ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FORCE MEASUREMENT; INTERFEROMETERS; PHASE SHIFT; RESONANCE; SUBSTRATES;

SCANNING NEAR FIELD OPTICAL MICROSCOPY; SHEAR FORCE MEASUREMENT; TUNNELLING MEASUREMENT;

OPTICAL MICROSCOPY;

ARTICLE; ARTIFACT; FORCE; IMAGE QUALITY; IMAGING SYSTEM; SCANNING NEAR FIELD OPTICAL MICROSCOPY; TOPOGRAPHY;

EID: 0032033569     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00078-8     Document Type: Article

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