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Volumn 70, Issue 12, 1999, Pages 4612-4617

Microindentation device for in situ study of pressure-induced phase transformations

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0011020804     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150122     Document Type: Article
Times cited : (23)

References (16)
  • 7
    • 0042509105 scopus 로고    scopus 로고
    • Ph.D. dissertation, Eberhard-Karls-Universität, Tübingen
    • A. Kailer, Ph.D. dissertation, Eberhard-Karls-Universität, Tübingen (1998).
    • (1998)
    • Kailer, A.1
  • 9
    • 0043010101 scopus 로고    scopus 로고
    • Germany
    • Kammrath and Weiss, Germany, Company Newsletter (1997).
    • (1997) Company Newsletter
  • 12
    • 0043010101 scopus 로고    scopus 로고
    • CSEM, Switzerland
    • Raman Scratch Tester, CSEM, Switzerland, Company Newsletter (1997), (http://www.csem.ch/instrum).
    • (1997) Company Newsletter


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.