Near-field optical patterning and structuring based on local-field enhancement at the extremity of a metal tip

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 362, Issue 1817, 2004, Pages 821-842

  Royer, Pascal ^a   Barchiesi, Dominique ^a   Lerondel, Gilles ^a   Bachelot, Renaud ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

Field enhancement (FE); Finite element method (FEM); Lithography; Nanostructuration; Photosensitive materials; Scanning near field optical microscope (SNOM)

Indexed keywords

EID: 1842536841     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2003.1349     Document Type: Review

References (53)

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