Sub-wavelength imaging by depolarization in a reflection near-field optical microscope using an uncoated fiber probe

Optics Communications

Volumn 146, Issue 1-6, 1998, Pages 277-284

  Madsen, S ^a,c   Bozhevolnyi, S I ^b   Hvam, J M ^c  

^a DME Danish Micro Engineering A/S   (Denmark)

^b AALBORG UNIVERSITY   (Denmark)

^c TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Near field optical microscopy; Shear force microscopy; Subwavelength resolution

Indexed keywords

LIGHT POLARIZATION; LIGHT PROPAGATION; LIGHT REFLECTION; OPTICAL FIBERS; OPTICAL RESOLVING POWER; PROBES; SCANNING;

NEAR FIELD OPTICAL MICROSCOPY; SHEAR FORCE MICROSCOPY; SUBWAVELENGTH RESOLUTION;

OPTICAL MICROSCOPY;

EID: 0031678129     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(97)00501-4     Document Type: Article

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