Nanoscale chemical analysis by tip-enhanced Raman spectroscopy

Chemical Physics Letters

Volumn 318, Issue 1-3, 2000, Pages 131-136

  Stöckle, Raoul M ^a   Suh, Yung Doug ^a   Deckert, Volker ^a   Zenobi, Renato ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000274050     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(99)01451-7     Document Type: Article

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