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Volumn 8, Issue 21, 2012, Pages 3233-3252

In situ TEM electromechanical testing of nanowires and nanotubes

(3) Espinosa, Horacio D a Bernal, Rodrigo A a Filleter, Tobin a,b

a Northwestern University (United States)

b UNIVERSITY OF TORONTO (Canada)

Author keywords

electromechanical testing; in situ testing; nanotubes; nanowires; TEM

Indexed keywords

ADVANCED MATERIALS; ATOMIC SCALE; DEFECT CHARACTERIZATION; ELECTRICAL CHARACTERIZATION; ELECTROMECHANICAL TESTING; IN-SITU TECHNIQUES; IN-SITU TEM; IN-SITU TESTING; MECHANICAL DEFORMATION; NANO-SCALE SYSTEM; ONE-DIMENSIONAL NANOSTRUCTURE; TEMPORAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY TEM;

CHARACTERIZATION; ELECTROMECHANICAL DEVICES; NANOWIRES; TRANSMISSION ELECTRON MICROSCOPY;

NANOTUBES;

EID: 84868379204 PISSN: 16136810 EISSN: 16136829 Source Type: Journal
DOI: 10.1002/smll.201200342 Document Type: Review

Times cited : (80)

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