Development of a nanoindenter for in situ transmission electron microscopy

Microscopy and Microanalysis

Volumn 7, Issue 6, 2001, Pages 507-517

  Stach, Eric A ^a   Freeman, Tony ^a   Minor, Andrew M ^a,b   Owen, Doug K ^a   Cumings, John ^a,c   Wall, Mark A ^d   Chraska, Tomas ^e   Hull, Robert ^e   Morris Jr , J W ^a,b   Zettl, A ^a,c   Dahmen, Ulrich ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b Lawrence Berkeley National Laboratory   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^e University of Virginia   (United States)

Author keywords

Deformation; Diffraction contrast; Dislocations; In situ; Nanoindentation; Thin films; Transmission electron microscopy

Indexed keywords

EID: 0035516777     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (21)

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