Electric and magnetic phenomena studied by in situ transmission electron microscopy

MRS Bulletin

Volumn 33, Issue 2, 2008, Pages 101-106

  Cumings, John ^a   Olsson, Eva ^a   Petford Long, Amanda K ^a   Zhu, Yimei ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; IMAGING SYSTEMS; METASTABLE PHASES; NANOSTRUCTURED MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

IMAGING BEAMS; NANOSCALE FEATURES; OPERATIONAL DEVICES;

ELECTROMAGNETIC FIELDS;

EID: 39849109832     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2008.22     Document Type: Article

References (67)