Source truncation and exhaustion: Insights from quantitative in situ TEM tensile testing

Nano Letters

Volumn 11, Issue 9, 2011, Pages 3816-3820

  Kiener, D ^a,b,c   Minor, A M ^a,b  

^a Lawrence Berkeley National Laboratory   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF LEOBEN   (Austria)

Author keywords

dislocation structure; In situ tensile testing; size effect; strengthening mechanism; transmission electron microscopy (TEM)

Indexed keywords

DISLOCATION STRUCTURES; IN SITU TENSILE TESTING; SIZE EFFECTS; STRENGTHENING MECHANISM; TRANSMISSION ELECTRON;

MATERIALS TESTING APPARATUS; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY;

TENSILE TESTING;

EID: 80052787435     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl201890s     Document Type: Article

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