In situ TEM nanoindentation of nanoparticles

Micron

Volumn 43, Issue 11, 2012, Pages 1134-1139

  Carlton, C E ^a   Ferreira, P J ^b  

^a Massachusetts Institute of Technology   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

Deformation; Dislocations; In situ TEM; Nanoindentation; Nanoparticles

Indexed keywords

DEFORMATION BEHAVIOR; DIFFRACTION CONTRAST; IN-SITU; IN-SITU TEM; MATERIALS RESEARCH; NANOINDENTATION EXPERIMENTS; PHASE CONTRASTS; REAL TIME; SILVER NANOPARTICLES;

DEFORMATION; DISLOCATIONS (CRYSTALS); EXPERIMENTS; NANOINDENTATION; NANOPARTICLES; UNLOADING;

SILVER;

EID: 84864796821     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2012.03.002     Document Type: Article

References (18)

1. Armstrong P., Knieke C., Mackovic M., Frank G., Hartmaier A., Goken M., Peukert W. Microstructural evolution during deformation of tin dioxide nanoparticles in a comminution process. Acta Mater. 2009, 57:3060.
2. Deneen J., Mook W.M., Minor A., Gerberich W.W., Carter C.B. In situ deformation of silicon nanospheres. J. Mater. Sci. 2006, 41:4477.
3. Deneen J., Mook W.M., Minor A., Gerberich W.W., Carter C.B. Fracturing a nanoparticle. Philos. Mag. 2007, 87:29.
4. Ganesh K.J., Kawasaki M., Zhou J.P., Ferreira P.J. D-STEM: a parallel diffraction technique applied to nanomaterials. Microsc. Microanal. 2010, 16:614.
5. Gerberich W.W., Mook W.M., Perrey C.R., Carter C.B., Baskes M.I., Mukherjee R., Gidwani A., Heberlein J., McMurry P.H., Girshick S.L. Superhard silicon nanospheres. J. Mech. Phys. Solids 2003, 51:979.
6. Gerberich W.W., Mook W.M., Cordill M.J., Carter C.B., Heberlein J., Girshick S.L. Reverse plasticity in single crystal silicon nanospheres. Int. J. Plast. 2005, 21:2391.
7. Gerberich W.W., Mook W.M., Chambers M.D., Cordill M.J., Perrey C.R., Carter C.B., Miller R.E., Curtin W.A., Girshick S.L. An energy balance criterion for nanoindentation-induced single and multiple dislocation events. J. Appl. Mech. 2006, 73:327.
8. Li S., Bouwer J., Duttweiler F., Ellisman M., Jin M., Leblanc P., Milazzo A., Peltier S., Xuong N., Kleinfelder S. A new direct detection camera system for electron microscopy. Conference on Sensors, Cameras and Systems for Scientific/Industrial Applications VII 2006.
9. Lockwood A.J., Inkson B.J. In situ TEM nanoindentation and deformation of Si-nanoparticle clusters. J. Phys. D: Appl. Phys. 2009, 42:035410.
10. Minor A.M., Lilleodden E.T., Jin M., Stach E.A., Chrzan D., Morris J.W. Room temperature dislocation plasticity in silicon. Philos. Mag. A 2005, 85:323.
11. Minor A.M., Asif S.A.S., Shan Z., Stach E.A., Cyrankowski E., Wyrobek T.J., Warren O.L. A new view of the onset of plasticity during the nanoindentation of alumninium. Nat. Mater. 2006, 5:697.
12. Mook W.M., Nowak J.D., Perrey C.R., Carter C.B., Mukherjee R., Girshick S.L., McMurry P.H., Gerberich W.W. Compressive stress effects on nanoparticle modulus and fracture. Phys. Rev. B 2007, 75:214112.
13. Mordehai D., Kazakevich M., Srolovitz D.J., Rabkin E. Nanoindentation size effect in single-crystal nanoparticles and thin films: a comparative experimental and simulation study. Acta Mater. 2011, 59:2309.
14. Shan Z.W., Adesso G., Cabot A., Sherburne M.P., Syed Asif S.A., Warren O.L., Chrzan D.C., Minor A.M., Alivasatos A.P. Ultrahigh stress and strain in hierarchically structured hollow nanoparticles. Nat. Mater. 2008, 7:947.
15. Slouf M., Kuzel R., Matej Z. Preparation and characterization of isometric gold. Zietshrift fur Kristallographie 2006, 319-324:2.
16. Vincent R., Midgley P.A. Double conical beam-rocking system for measurement of integrated electron diffraction intensities. Ultramicroscopy 1994, 53:271.
17. Wu Y., Takeguchi M., Chen Q., Furuya K. Defects and their movement in Pb and Ge nanocrystals characterized by ultra high vacuum high resolution transmission electron microscope. Appl. Surf. Sci. 2000, 159-160:486.
18. Zhang N., Deng Q.A., Hong Y., Xiong L., Shi L., Strasberg M., Yin W., Zou Y., Taylor C.R., Sawyer G., Chen Y. Deformation mechanisms in silicon nanoparticles. J. Appl. Phys. 2011, 109:063534.