SCOPUS 정보 검색 플랫폼

Pure and Applied Chemistry

Volumn 72, Issue 1-2, 2000, Pages 209-219

Nanomeasurements of individual carbon nanotubes by in situ TEM

(3) Wang, Z L a Poncharal, P a De Heer, W A a

a Georgia Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON;

CONFERENCE PAPER; ELECTRIC FIELD; ELECTRODE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; MATERIALS; MEASUREMENT; NANOPARTICLE; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034583341 PISSN: 00334545 EISSN: None Source Type: Journal
DOI: 10.1351/pac200072010209 Document Type: Conference Paper

Times cited : (91)

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3
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- in press
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4
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7
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- Treacy, M.M.¹ Ebbesen, T.W.² Gibson, J.M.³

8
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- McGraw-Hill, New York
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9
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10
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12
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13
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.