Measurements of the atomistic mechanics of single crystalline silicon wires of nanometer width

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 3, 2005, Pages

  Kizuka, Tokushi ^a,b   Takatani, Yasuhiro ^a   Asaka, Koji ^b   Yoshizaki, Ryozo ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33749233534     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.035333     Document Type: Article

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