A low cost platform for linking transport properties to the structure of nanomaterials

Nanotechnology

Volumn 17, Issue 5, 2006, Pages 1470-1475

  Xu, S Y ^a   Xu, J ^a   Tian, M L ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON TRANSPORT PROPERTIES; MORPHOLOGY; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

EX SITU TRANSPORT MEASUREMENTS; IN SITU LOCAL STRUCTURE MODIFICATION;

NANOSTRUCTURED MATERIALS;

EID: 33144489016     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/17/5/051     Document Type: Article

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