Electronic property investigations of single-walled carbon nanotube bundles in situ within a transmission electron microscope: An evaluation

Journal of Microscopy

Volumn 231, Issue 1, 2008, Pages 144-155

  Aslam, Z ^a   Abraham, M ^a   Brown, A ^a   Rand, B ^a   Brydson, R ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Deformation; EELS; I V measurements; Single walled carbon nanotubes; STM; TEM; TEM STM

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONIC PROPERTIES; ENERGY DISSIPATION; GRAPHENE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN); YARN;

ELECTRON ENERGY-LOSS SPECTROSCOPIES; I-V MEASUREMENTS; MECHANICAL AND ELECTRICAL PROPERTIES; SAMPLE HOLDERS; SIMULTANEOUS OBSERVATION; SINGLE WALLED CARBON NANOTUBE; SINGLE-WALLED CARBON; SINGLE-WALLED CARBON NANOTUBE BUNDLE; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPY-SCANNING TUNNELING MICROSCOPY;

SCANNING TUNNELING MICROSCOPY;

SINGLE WALLED NANOTUBE;

ALGORITHM; ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; GONIOMETRY; IMAGING AND DISPLAY; IMAGING SYSTEM; MATHEMATICAL ANALYSIS; NONHUMAN; OPTICAL RESOLUTION; PIEZOELECTRICITY; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; STRUCTURE ACTIVITY RELATION; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 46749126631     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.02025.x     Document Type: Article

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