Giant piezoresistance effects in silicon nanowires and microwires

Physical Review Letters

Volumn 105, Issue 22, 2010, Pages

  Milne, J S ^a   Rowe, A C H ^a   Arscott, S ^b   Renner, Ch ^c  

^a LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

^b INSTITUT D ELECTRONIQUE   (France)

^c UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED STRESS; BULK SILICON; HOLE TRAPPING; MICRO WIRE; PIEZORESISTANCE; PIEZORESISTANCE EFFECTS; SAMPLE SURFACE; SILICON NANOWIRES; TIME VARYING;

NANOWIRES;

EID: 78649368594     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.105.226802     Document Type: Article

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