An electromechanical material testing system for in situ electron microscopy and applications

Proceedings of the National Academy of Sciences of the United States of America

Volumn 102, Issue 41, 2005, Pages 14503-14508

  Zhu, Yong ^a   Espinosa, Horacio D ^a  

^a Northwestern University   (United States)

Author keywords

Carbon nanotube; Microelectromechanical system; Nanomechanics; Nanowires

Indexed keywords

CARBON NANOTUBE;

ARTICLE; CALIBRATION; ELECTRON MICROSCOPY; MATERIALS TESTING; MECHANICS; NANOTECHNOLOGY; PRIORITY JOURNAL; SENSOR; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY;

EID: 26844529198     PISSN: 00278424     EISSN: None     Source Type: Journal    
DOI: 10.1073/pnas.0506544102     Document Type: Article

References (29)

1. Iijima, S. (1991) Nature 354, 56-58.
2. Fennimore, A. M., Yuzvinsky, T. D., Han, W. Q., Fuhrer, M. S., Cumings, J. & Zettl, A. (2003) Nature 424, 408-410.
3. Cui, Y. & Lieber, C. M. (2001) Science 291, 851-853.
4. Marszalek, P. E., Greenleaf, W. J., Li, H., Oberhauser, A. F. & Fernandez, J. M. (2000) Proc. Natl. Acad. Sci. USA 97, 6282-6286.
5. Oliver, W. C. & Pharr, G. M. (1992) J. Mater. Res. 7, 1564.
6. Saif, M. T. A. & MacDonald. (1996) Sens. Actuators A 52, 65-75.
7. Kahn, H., Ballarini, R., Mullen, R. L. & Heuer, A. H. (1999) Proc. R. Soc. London A 455, 3807-3823.
8. Hugo, R. C., Kung, H., Weertman, J. R., Mitra, R., Knapp, J. A. & Follstaedt, D. M. (2003) Acta Materialia 51, 1937-1943.
9. Ke, M., Hackney, S. A., Milligan, W. W. & Aifantis, E. C. (1995) Nanostruct. Mater. 5, 689-698.
10. Chasiotis, I. & Knauss, W. G. (2003) J. Mech. Phys. Solids 51, 1533-1550.
11. Sharpe, W. N., Jr., Jackson, K. M. Hemker, K. J. & Xie, Z. (2001) J. Microelectromech. Syst. 10, 317-326.
12. Yu, M. F., Lourie, O., Dyer, M. J., Moloni, K., Kelly, T. F. & Ruoff, R. S. (2000) Science 287, 637-640.
13. Haque, M. A. & Saif, M. T. A. (2002) Exp. Mech. 42, 123-128.
14. Haque, M. A. & Saif, M. T. A. (2004) Proc. Natl. Acad. Sci. USA 101, 6335-6340.
15. Zhu, Y., Moldovan, N. & Espinosa, H. D. (2005) Appl. Phys. Lett. 86, 013506.
16. Williams, P. A., Papadakis, S. J., Falvo, M. R., Patel, A. M., Sinclair, M., Seeger, A., Helser, A., Taylor, R. M., II, Washburn, S. & Superfine, R. (2002) Appl. Phys. Lett. 80, 2574-2576.
17. Kong, J., Soh, H. T., Cassell, A., Quate, C. F. & Dai, H. (1998) Nature 395, 878-881.
18. Tang, W. C., Ngugen, T-C. & Howe, R. T. (1992) Sens. Actuators A 21, 328-331.
19. Prorok, B. C., Zhu, Y., Espinosa, H. D., Guo, Z., Bazant, Z. P., Zhao, Y. & Yakobson, B. I. (2004) in Encyclopedia of Nanoscience and Nanotechnology, ed. Nalwa, H. S. (American Scientific, Stevenson Ranch, CA), pp. 555-600.
20. Senturia, S. D. (2002) Microsystem Design (Kluwer Academic, Boston).
21. Greek, S., Ericson, F., Johansson, S. & Schweitz, J. (1997) Thin Solid Films 292, 247-254.
22. Xiao, Z. L., Man, C. Y., Welp, U., Wang, H. H., Kwok, W. K., Willing, G. A., Miller, J. M., Cook, R. E., Miller, D. J. & Crabtree, G. W. (2002) Nano Lett. 2, 1293-1297.
23. Simmons, G. & Wang, H. (1971) Single Crystal Elastic Constants and Calculated Aggregate Properties: A Handbook (MIT Press, Cambridge, MA).
24. Sakei, S. Tanimoto, H. & Mizubayshi, H. (1999) Acta Mater. 47, 211-217.
25. Courtney, T. H. (2000) Mechanical Behavior of Materials (McGraw-Hill, Boston).
26. Espinosa, H. D., Prorok, B. C. & Peng, B. (2004) J. Mech. Phys. Solids 52, 667-689.
27. Uchic, M. D., Dimiduk, D. M., Florando, J. N. & Nix, W. D. (2004) Science 305, 986-989.
28. Minor, A. M., Morris, J. W., Jr., & Stach, E. A. (2001) Appl. Phys. Lett. 79, 1625-1627.
29. Dai, H., Hafner, J. H., Rinzler, A. G., Colbert, D. T. & Smalley, R. E. (1996) Nature 384, 52-54.