메뉴 건너뛰기




Volumn 2, Issue 2, 2002, Pages 165-168

Crystalline Silver Nanowires by Soft Solution Processing

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000994547     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl010093y     Document Type: Article
Times cited : (1529)

References (34)
  • 10
    • 0028594017 scopus 로고
    • See, for example, (a) Martin, C. R. Science 1994, 266, 1961. (b) Martin, B. R.; Dermody, D. J.; Reiss, B. D.; Fang, M.; Lyon, L. A.; Natan, M. J.; Mallouk, T. E. Adv. Mater. 1999, 11, 1021. Zhang, Z.; Gekhtman, D.; Dresselhaus, M. S.; Ying, J. Y. Chem. Mater. 1999, 11, 1659.
    • (1994) Science , vol.266 , pp. 1961
    • Martin, C.R.1
  • 12
    • 0000500801 scopus 로고    scopus 로고
    • See, for example, (a) Martin, C. R. Science 1994, 266, 1961. (b) Martin, B. R.; Dermody, D. J.; Reiss, B. D.; Fang, M.; Lyon, L. A.; Natan, M. J.; Mallouk, T. E. Adv. Mater. 1999, 11, 1021. (c) Zhang, Z.; Gekhtman, D.; Dresselhaus, M. S.; Ying, J. Y. Chem. Mater. 1999, 11, 1659.
    • (1999) Chem. Mater. , vol.11 , pp. 1659
    • Zhang, Z.1    Gekhtman, D.2    Dresselhaus, M.S.3    Ying, J.Y.4
  • 24
    • 0348175954 scopus 로고    scopus 로고
    • note
    • w ≈ 40 000) were added to the ethylene glycol containing platinum seeds. This reaction mixture was then constantly heated at 160 °C for various periods of time up to ∼60 min. The nanowires were separated from particles using centrifugation. In this case, the reaction mixture was cooled to room temperature, diluted with acetone (about 10 times by volume), and centrifuged at 2000 rpm for 20 min. The nanowires settled down to the bottom of the container under centrifugation while the nanoparticles that still remained in the liquid phase were removed using a pipet. This separation procedure was repeated several times until nanowire samples essentially free of particles were obtained. The SEM images were obtained on a field emission microscope (FSEM, JEOL-6300F, Peabody, MA) operating at an accelerating voltage of 15 kV. The TEM images and microdiffraction patterns were taken on a JEOL-1200EX II microscope (80 kV). High-resolution TEM images were obtained on a TOPCON 002B microscope operated at 160 kV. XRD measurements were obtained with a Philips PW1710 diffractometer (Cu-Kα radiation).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.