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MRS Bulletin

Volumn 35, Issue 5, 2010, Pages 354-360

Quantitative in situ mechanical testing in electron microscopes

(3) Legras, M a Gianola, D S a Motz, C a

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPES; IMAGE ENHANCEMENT; SCANNING ELECTRON MICROSCOPY;

DIGITAL IMAGE ACQUISITION; IN-SITU ELECTRON MICROSCOPY; NANOMECHANICAL TESTS; RECENT PROGRESS; SAMPLE PREPARATION;

MECHANICAL TESTING;

EID: 77952710647 PISSN: 08837694 EISSN: None Source Type: Journal
DOI: 10.1557/mrs2010.567 Document Type: Article

Times cited : (108)

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