Structural peculiarities of in situ deformation of a multi-walled BN nanotube inside a high-resolution analytical transmission electron microscope

Acta Materialia

Volumn 55, Issue 4, 2007, Pages 1293-1298

  Golberg, D ^a   Bai, X D ^a,b   Mitome, M ^a   Tang, C C ^a   Zhi, C Y ^a   Bando, Y ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b INSTITUTE OF PHYSICS   (China)

Author keywords

Analytical electron microscopy; Bending test; Deformation structure; Electron diffraction; Nitrides

Indexed keywords

BENDING (DEFORMATION); BORON COMPOUNDS; GRAPHITIZATION; MOLECULAR STRUCTURE; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ANALYTICAL ELECTRON MICROSCOPY; BENDING TESTS; BORON NITRIDE (BN); DEFORMATION STRUCTURE;

NANOTUBES;

EID: 33846590957     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.09.034     Document Type: Article

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